Showing results 1 to 2 of 2
Title | Author(s) | Issue Date | Views | |
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Statistical Study of Bias Temperature Instabilities by Means of 3D 'Atomistic' Simulation Book:Bias Temperature Instability for Devices and Circuits | 2013 | 50 | ||
Understanding variability in complementary metal oxide semiconductor (CMOS) devices manufactured using silicon-on-insulator (SOI) technology Book:Silicon-On-Insulator (SOI) Technology: Manufacture and Applications | 2014 | 55 |