Showing results 1 to 2 of 2
Title | Author(s) | Issue Date | |
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3D dynamic RTN simulation of a 25nm MOSFET: The importance of variability in reliability evaluation of decananometer devices Proceeding/Conference:2012 15th International Workshop on Computational Electronics, IWCE 2012 | 2012 | ||
Impact of statistical variability and 3D electrostatics on post-cycling anomalous charge loss in nanoscale Flash memories Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings | 2013 |