Showing results 1 to 2 of 2
| Title | Author(s) | Issue Date | |
|---|---|---|---|
Three-dimensional statistical simulation of gate leakage fluctuations due to combined interface roughness and random dopants Journal:Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2007 | ||
Direct tunnelling gate leakage variability in Nano-CMOS transistors Journal:IEEE Transactions on Electron Devices | 2010 |