Showing results 1 to 2 of 2
Title | Author(s) | Issue Date | |
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Characterization of charge trapping and high-field endurance for 15-nm thermally nitrided oxides Journal:IEEE Transactions on Electron Devices | 1991 | ||
Mechanisms for hot-carrier-induced degradation in reoxidized-nitrided-oxide n-MOSFET's under combined AC/DC stressing Journal:IEEE Transactions on Electron Devices | 1993 |