| Title | Author(s) | Year | View Count |
 | Interface characterisation and internal electric field evaluation of a-Si:H pin solar cell by variable energy positron annhilation spectroscopy | Zou, X; Chan, YC; Webb, DP; Lam, YW; Chan, FYM; Lin, SH; Hu, YF; Beling, CD; Fung, SHY | 1999 | 397 |
| Identification of vacancy-like defects in high-rate grown a-Si before and after ligh soaking by vepas | Zou, X; Chan, YC; Webb, DP; Lam, YW; Lin, SH; Chan, FYM; Hu, YF; Weng, X; Beling, CD; Fung, SHY | 1999 | 351 |
 | Interface characterization and internal electric field evaluation of a-Si:H pin solar cell by variable energy positron annihilation spectroscopy | Zou, X; Chan, YC; Webb, DP; Lam, YW; Chan, FYM; Lin, SH; Hu, YF; Beling, CD; Fung, S | 1999 | 30 |
| Identification of vacancy-like defects in high-rate grown a-Si before and after light soaking by VEPAS | Zou, X; Chan, YC; Webb, DP; Lam, YW; Lin, SH; Chan, FYM; Hu, YF; Weng, X; Beling, CD; Fung, S | 1999 | 34 |
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