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TypeTitleAuthor(s)YearViews
Interface characterization and internal electric field evaluation of a-Si:H pin solar cell by variable energy positron annihilation spectroscopyZou, X; Chan, YC; Webb, DP; Lam, YW; Chan, FYM; Lin, SH; Hu, YF; Beling, CD; Fung, S199948
 
Identification of vacancy-like defects in high-rate grown a-Si before and after light soaking by VEPASZou, X; Chan, YC; Webb, DP; Lam, YW; Lin, SH; Chan, FYM; Hu, YF; Weng, X; Beling, CD; Fung, S199956
 
Interface characterisation and internal electric field evaluation of a-Si:H pin solar cell by variable energy positron annhilation spectroscopyZou, X; Chan, YC; Webb, DP; Lam, YW; Chan, FYM; Lin, SH; Hu, YF; Beling, CD; Fung, SHY1999413
 
Identification of vacancy-like defects in high-rate grown a-Si before and after ligh soaking by vepasZou, X; Chan, YC; Webb, DP; Lam, YW; Lin, SH; Chan, FYM; Hu, YF; Weng, X; Beling, CD; Fung, SHY1999373
 
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