Showing results 1 to 2 of 2
Title | Author(s) | Issue Date | |
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Accuracy and issues of the spectroscopic analysis of RTN traps in nanoscale MOSFETs Journal:IEEE Transactions on Electron Devices | 2013 | ||
Comprehensive statistical comparison of RTN and BTI in deeply scaled MOSFETs by means of 3D atomistic simulation Proceeding/Conference:European Solid-State Device Research Conference | 2012 |