Showing results 2 to 4 of 4
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Title | Author(s) | Issue Date | |
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Impacts of Ti content and annealing temperature on electrical properties of Si MOS capacitors with HfTiON gate dielectric Proceeding/Conference:2009 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2009 | 2009 | ||
Influence of sidewall spacer on threshold voltage of MOSFET with high-k gate dielectric Journal:Microelectronics Reliability | 2008 | ||
2012 |