Showing results 18 to 19 of 19
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Title | Author(s) | Issue Date | Views | |
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Three-dimensional statistical simulation of gate leakage fluctuations due to combined interface roughness and random dopants Journal:Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2007 | 35 | ||
Towards polyoxometalate-cluster-based nano-electronics Journal:Chemistry - A European Journal | 2013 | 36 |