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Conference Paper: SPM characterization of chemically and electrochemically etched p-silicon

TitleSPM characterization of chemically and electrochemically etched p-silicon
Authors
Yu, KFChi, NChan, GKYPhillips, DL
Issue Date1997
Citation
The 1997 Joint International Meeting of The Electrochemical Society (192nd Meeting) and The International Society of Electrochemistry (48th Annual Meeting), Paris, August 31 - September 5, v. 97 n. 2, p. Abstract No. 22 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/97578

 

DC FieldValueLanguage
dc.contributor.authorYu, KFen_HK
dc.contributor.authorChi, Nen_HK
dc.contributor.authorChan, GKYen_HK
dc.contributor.authorPhillips, DLen_HK
dc.date.accessioned2010-09-25T17:14:15Z-
dc.date.available2010-09-25T17:14:15Z-
dc.date.issued1997en_HK
dc.identifier.citationThe 1997 Joint International Meeting of The Electrochemical Society (192nd Meeting) and The International Society of Electrochemistry (48th Annual Meeting), Paris, August 31 - September 5, v. 97 n. 2, p. Abstract No. 22en_HK
dc.identifier.urihttp://hdl.handle.net/10722/97578-
dc.languageengen_HK
dc.relation.ispartofThe 1997 Joint International Meeting of The Electrochemical Society (192nd Meeting) and The International Society of Electrochemistry (48th Annual Meeting), Paris, August 31 - September 5en_HK
dc.titleSPM characterization of chemically and electrochemically etched p-siliconen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailChan, GKY: hrsccky@hku.hken_HK
dc.identifier.emailPhillips, DL: phillips@hku.hken_HK
dc.identifier.authorityChan, GKY=rp00662en_HK
dc.identifier.authorityPhillips, DL=rp00770en_HK
dc.identifier.hkuros31722en_HK
dc.identifier.volume, v. 97 n. 2en_HK
dc.identifier.issue2en_HK

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