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Article: Numerical deembedding technique for planar discontinuities with periodically nonuniform feed lines
Title | Numerical deembedding technique for planar discontinuities with periodically nonuniform feed lines |
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Authors | |
Keywords | Deembedding Method of moments Periodically nonuniform feed line Planar discontinuity Short-open calibration technique |
Issue Date | 2008 |
Publisher | John Wiley & Sons, Inc. The Journal's web site is located at http://www3.interscience.wiley.com/cgi-bin/jhome/39041 |
Citation | International Journal Of Rf And Microwave Computer-Aided Engineering, 2008, v. 18 n. 5, p. 496-504 How to Cite? |
Abstract | A numerical short-open calibration technique is applied to deembedding of planar discontinuities with periodically perturbed nonuniform feed lines in the full-wave method of moments (MoM) algorithm. Different from the other deembedding techniques that are based on the assumption of uniform feed lines, this proposed technique exhibits an unparalleled capability on modeling of planar circuits with nonuniform feed lines. To demonstrate this feature, the open and gap discontinuities are modeled under periodically nonuniform feed configuration, and the effective per-unit-length transmission parameters of slow-wave and electromagnetic bandgap structures are extracted from the full-wave MoM simulation. Two periodically nonuniform microstrip-line resonator circuits are modeled and then confirmed by EM simulators and measurement. © 2008 Wiley Periodicals, Inc. |
Persistent Identifier | http://hdl.handle.net/10722/92862 |
ISSN | 2023 Impact Factor: 0.9 2023 SCImago Journal Rankings: 0.361 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
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dc.contributor.author | Sun, S | en_HK |
dc.contributor.author | Zhu, L | en_HK |
dc.date.accessioned | 2010-09-22T05:01:53Z | - |
dc.date.available | 2010-09-22T05:01:53Z | - |
dc.date.issued | 2008 | en_HK |
dc.identifier.citation | International Journal Of Rf And Microwave Computer-Aided Engineering, 2008, v. 18 n. 5, p. 496-504 | en_HK |
dc.identifier.issn | 1096-4290 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/92862 | - |
dc.description.abstract | A numerical short-open calibration technique is applied to deembedding of planar discontinuities with periodically perturbed nonuniform feed lines in the full-wave method of moments (MoM) algorithm. Different from the other deembedding techniques that are based on the assumption of uniform feed lines, this proposed technique exhibits an unparalleled capability on modeling of planar circuits with nonuniform feed lines. To demonstrate this feature, the open and gap discontinuities are modeled under periodically nonuniform feed configuration, and the effective per-unit-length transmission parameters of slow-wave and electromagnetic bandgap structures are extracted from the full-wave MoM simulation. Two periodically nonuniform microstrip-line resonator circuits are modeled and then confirmed by EM simulators and measurement. © 2008 Wiley Periodicals, Inc. | en_HK |
dc.language | eng | en_HK |
dc.publisher | John Wiley & Sons, Inc. The Journal's web site is located at http://www3.interscience.wiley.com/cgi-bin/jhome/39041 | en_HK |
dc.relation.ispartof | International Journal of RF and Microwave Computer-Aided Engineering | en_HK |
dc.subject | Deembedding | en_HK |
dc.subject | Method of moments | en_HK |
dc.subject | Periodically nonuniform feed line | en_HK |
dc.subject | Planar discontinuity | en_HK |
dc.subject | Short-open calibration technique | en_HK |
dc.title | Numerical deembedding technique for planar discontinuities with periodically nonuniform feed lines | en_HK |
dc.type | Article | en_HK |
dc.identifier.email | Sun, S:sunsheng@hku.hk | en_HK |
dc.identifier.authority | Sun, S=rp01431 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1002/mmce.20312 | en_HK |
dc.identifier.scopus | eid_2-s2.0-51449087123 | en_HK |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-51449087123&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 18 | en_HK |
dc.identifier.issue | 5 | en_HK |
dc.identifier.spage | 496 | en_HK |
dc.identifier.epage | 504 | en_HK |
dc.identifier.eissn | 1099-047X | - |
dc.identifier.isi | WOS:000258856800012 | - |
dc.publisher.place | United States | en_HK |
dc.identifier.scopusauthorid | Sun, S=7404509453 | en_HK |
dc.identifier.scopusauthorid | Zhu, L=7404201926 | en_HK |