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Article: Technological knowledge, product relatedness, and parent control: The effect on IJV survival

TitleTechnological knowledge, product relatedness, and parent control: The effect on IJV survival
Authors
KeywordsChina
Cox regression
Equity control
IJV survival
Japan
Managerial control
Product relatedness
Technological knowledge
Issue Date2007
PublisherElsevier Inc. The Journal's web site is located at http://www.elsevier.com/locate/jbusres
Citation
Journal Of Business Research, 2007, v. 60 n. 11, p. 1166-1176 How to Cite?
AbstractThis article examines the relationships among parent firm technological knowledge, parent-IJV product relatedness, parent control over the IJV, and IJV survival. Combining the knowledge-based perspective and institutional theory, we argue that parent control itself does not necessarily lead to higher IJV survival; it contributes to IJV survival when the parent firm has a high level of technological knowledge, and when the IJV is product-related to this parent. Results obtained from 1038 Japanese IJVs based in China indicate that both equity control and managerial control of a Japanese parent had a positive interaction effect, with the parent's technological knowledge, on IJV survival. Equity control also exhibited a positive interaction effect with product relatedness. In a sub-sample of 354 Sino-Japanese IJVs containing local parent information, managerial control by the Chinese parent was found to have a positive interaction effect, with Chinese parent-IJV product relatedness, on IJV survival. © 2007 Elsevier Inc. All rights reserved.
Persistent Identifierhttp://hdl.handle.net/10722/85853
ISSN
2021 Impact Factor: 10.969
2020 SCImago Journal Rankings: 2.049
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorXu, Den_HK
dc.contributor.authorLu, JWen_HK
dc.date.accessioned2010-09-06T09:10:00Z-
dc.date.available2010-09-06T09:10:00Z-
dc.date.issued2007en_HK
dc.identifier.citationJournal Of Business Research, 2007, v. 60 n. 11, p. 1166-1176en_HK
dc.identifier.issn0148-2963en_HK
dc.identifier.urihttp://hdl.handle.net/10722/85853-
dc.description.abstractThis article examines the relationships among parent firm technological knowledge, parent-IJV product relatedness, parent control over the IJV, and IJV survival. Combining the knowledge-based perspective and institutional theory, we argue that parent control itself does not necessarily lead to higher IJV survival; it contributes to IJV survival when the parent firm has a high level of technological knowledge, and when the IJV is product-related to this parent. Results obtained from 1038 Japanese IJVs based in China indicate that both equity control and managerial control of a Japanese parent had a positive interaction effect, with the parent's technological knowledge, on IJV survival. Equity control also exhibited a positive interaction effect with product relatedness. In a sub-sample of 354 Sino-Japanese IJVs containing local parent information, managerial control by the Chinese parent was found to have a positive interaction effect, with Chinese parent-IJV product relatedness, on IJV survival. © 2007 Elsevier Inc. All rights reserved.en_HK
dc.languageengen_HK
dc.publisherElsevier Inc. The Journal's web site is located at http://www.elsevier.com/locate/jbusresen_HK
dc.relation.ispartofJournal of Business Researchen_HK
dc.rightsJournal of Business Research. Copyright © Elsevier Inc.en_HK
dc.subjectChinaen_HK
dc.subjectCox regressionen_HK
dc.subjectEquity controlen_HK
dc.subjectIJV survivalen_HK
dc.subjectJapanen_HK
dc.subjectManagerial controlen_HK
dc.subjectProduct relatednessen_HK
dc.subjectTechnological knowledgeen_HK
dc.titleTechnological knowledge, product relatedness, and parent control: The effect on IJV survivalen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0148-2963&volume=60&spage=1166&epage=1176&date=2007&atitle=Technological+knowledge,+product+relatedness,+and+parent+control:+The+effect+on+IJV+survivalen_HK
dc.identifier.emailXu, D: dxu@business.hku.hken_HK
dc.identifier.authorityXu, D=rp01119en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/j.jbusres.2006.08.008en_HK
dc.identifier.scopuseid_2-s2.0-34848861922en_HK
dc.identifier.hkuros145613en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-34848861922&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume60en_HK
dc.identifier.issue11en_HK
dc.identifier.spage1166en_HK
dc.identifier.epage1176en_HK
dc.identifier.isiWOS:000250649400007-
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridXu, D=7404073938en_HK
dc.identifier.scopusauthoridLu, JW=8758973000en_HK
dc.identifier.issnl0148-2963-

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