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Article: Effect of magnetic fields on the abnormal electroresistance behavior in epitaxial thin films of La0.8Ca0.2MnO3
| Title | Effect of magnetic fields on the abnormal electroresistance behavior in epitaxial thin films of La0.8Ca0.2MnO3 |
|---|---|
| Authors | |
| Keywords | Electroresistance Epitaxial thin films La 0.8Ca0.2MnO3 Magnetoresistance |
| Issue Date | 2006 |
| Publisher | Elsevier SA. The Journal's web site is located at http://www.elsevier.com/locate/mseb |
| Citation | Materials Science and Engineering B: Solid-State Materials for Advanced Technology, 2006, v. 126, p. 250-253 How to Cite? |
| Persistent Identifier | http://hdl.handle.net/10722/80925 |
| ISSN | 2023 Impact Factor: 6.1 2023 SCImago Journal Rankings: 1.660 |
| ISI Accession Number ID |
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Gao, J | en_HK |
| dc.contributor.author | Hu, F | en_HK |
| dc.date.accessioned | 2010-09-06T08:11:48Z | - |
| dc.date.available | 2010-09-06T08:11:48Z | - |
| dc.date.issued | 2006 | en_HK |
| dc.identifier.citation | Materials Science and Engineering B: Solid-State Materials for Advanced Technology, 2006, v. 126, p. 250-253 | en_HK |
| dc.identifier.issn | 0921-5093 | en_HK |
| dc.identifier.uri | http://hdl.handle.net/10722/80925 | - |
| dc.language | eng | en_HK |
| dc.publisher | Elsevier SA. The Journal's web site is located at http://www.elsevier.com/locate/mseb | en_HK |
| dc.relation.ispartof | Materials Science and Engineering B: Solid-State Materials for Advanced Technology | en_HK |
| dc.subject | Electroresistance | - |
| dc.subject | Epitaxial thin films | - |
| dc.subject | La 0.8Ca0.2MnO3 | - |
| dc.subject | Magnetoresistance | - |
| dc.title | Effect of magnetic fields on the abnormal electroresistance behavior in epitaxial thin films of La0.8Ca0.2MnO3 | en_HK |
| dc.type | Article | en_HK |
| dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0921-5093&volume=126&spage=250&epage=253&date=2006&atitle=Effect+of+magnetic+fields+on+the+abnormal+electroresistance+behavior+in+epitaxial+thin+films+of+La0.8Ca0.2MnO3 | en_HK |
| dc.identifier.email | Gao, J: jugao@hku.hk | en_HK |
| dc.identifier.email | Hu, F: fxhu2002@hku.hk | en_HK |
| dc.identifier.authority | Gao, J=rp00699 | en_HK |
| dc.identifier.scopus | eid_2-s2.0-30344476711 | - |
| dc.identifier.hkuros | 116575 | en_HK |
| dc.identifier.isi | WOS:000235115900031 | - |
| dc.identifier.issnl | 0921-5093 | - |