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Article: Doppler-broadening measurements of microvoids at the Au/GaAs interface
Title | Doppler-broadening measurements of microvoids at the Au/GaAs interface |
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Authors | |
Keywords | 68.35.-p 78.70.Bj |
Issue Date | 1995 |
Publisher | Springer Verlag. The Journal's web site is located at http://link.springer.de/link/service/journals/00339/index.htm |
Citation | Applied Physics A Materials Science & Processing, 1995, v. 60 n. 6, p. 545-549 How to Cite? |
Abstract | Recent positron lifetime studies made on the Au/GaAs interface with an applied electric field returning a significant fraction of bulk implanted positrons to the interface have revealed the presence of microvoids(≈ 1 nm diameter) at the interface. In this work an attempt has been made to study these microvoids by observing the Doppler broadening on the annihilation radiation coming from them. This is done both by observing the S-parameter as a function of applied bias and by applying the generalized least-squares method to the deconvolution of the annihilation radiation lineshape. The general conclusion is that the Doppler-broadened data are consistent with the majority of positrons trapping into microvoids, probably associated with grain boundaries. The data suggest that these open volume defects are more associated with the Au film rather than the Au-Ga alloyed interfacial region. © 1995 Springer-Verlag. |
Persistent Identifier | http://hdl.handle.net/10722/80689 |
ISSN | 2023 Impact Factor: 2.5 2023 SCImago Journal Rankings: 0.446 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Ling, CC | en_HK |
dc.contributor.author | Shan, YY | en_HK |
dc.contributor.author | Panda, BK | en_HK |
dc.contributor.author | Fleischer, S | en_HK |
dc.contributor.author | Beling, CD | en_HK |
dc.contributor.author | Fung, S | en_HK |
dc.date.accessioned | 2010-09-06T08:09:12Z | - |
dc.date.available | 2010-09-06T08:09:12Z | - |
dc.date.issued | 1995 | en_HK |
dc.identifier.citation | Applied Physics A Materials Science & Processing, 1995, v. 60 n. 6, p. 545-549 | en_HK |
dc.identifier.issn | 0947-8396 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/80689 | - |
dc.description.abstract | Recent positron lifetime studies made on the Au/GaAs interface with an applied electric field returning a significant fraction of bulk implanted positrons to the interface have revealed the presence of microvoids(≈ 1 nm diameter) at the interface. In this work an attempt has been made to study these microvoids by observing the Doppler broadening on the annihilation radiation coming from them. This is done both by observing the S-parameter as a function of applied bias and by applying the generalized least-squares method to the deconvolution of the annihilation radiation lineshape. The general conclusion is that the Doppler-broadened data are consistent with the majority of positrons trapping into microvoids, probably associated with grain boundaries. The data suggest that these open volume defects are more associated with the Au film rather than the Au-Ga alloyed interfacial region. © 1995 Springer-Verlag. | en_HK |
dc.language | eng | en_HK |
dc.publisher | Springer Verlag. The Journal's web site is located at http://link.springer.de/link/service/journals/00339/index.htm | en_HK |
dc.relation.ispartof | Applied Physics A Materials Science & Processing | en_HK |
dc.subject | 68.35.-p | en_HK |
dc.subject | 78.70.Bj | en_HK |
dc.title | Doppler-broadening measurements of microvoids at the Au/GaAs interface | en_HK |
dc.type | Article | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0947-8396&volume=60&spage=545&epage=549&date=1995&atitle=Doppler:+broadening+measurements+of+microvoids+at+the+Au/GaAs+interface | en_HK |
dc.identifier.email | Ling, CC: ccling@hkucc.hku.hk | en_HK |
dc.identifier.email | Beling, CD: cdbeling@hkucc.hku.hk | en_HK |
dc.identifier.email | Fung, S: sfung@hku.hk | en_HK |
dc.identifier.authority | Ling, CC=rp00747 | en_HK |
dc.identifier.authority | Beling, CD=rp00660 | en_HK |
dc.identifier.authority | Fung, S=rp00695 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1007/BF01538527 | en_HK |
dc.identifier.scopus | eid_2-s2.0-0029324498 | en_HK |
dc.identifier.hkuros | 9261 | en_HK |
dc.identifier.volume | 60 | en_HK |
dc.identifier.issue | 6 | en_HK |
dc.identifier.spage | 545 | en_HK |
dc.identifier.epage | 549 | en_HK |
dc.identifier.isi | WOS:A1995RD29600005 | - |
dc.publisher.place | Germany | en_HK |
dc.identifier.scopusauthorid | Ling, CC=13310239300 | en_HK |
dc.identifier.scopusauthorid | Shan, YY=7203036700 | en_HK |
dc.identifier.scopusauthorid | Panda, BK=22963418500 | en_HK |
dc.identifier.scopusauthorid | Fleischer, S=7103394445 | en_HK |
dc.identifier.scopusauthorid | Beling, CD=7005864180 | en_HK |
dc.identifier.scopusauthorid | Fung, S=7201970040 | en_HK |
dc.identifier.issnl | 0947-8396 | - |