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Article: Direct inversion of low-energy electron diffraction (LEED) IV spectra: The surface Patterson function

TitleDirect inversion of low-energy electron diffraction (LEED) IV spectra: The surface Patterson function
Authors
Tong, SYWu, H
Issue Date2002
PublisherInstitute of Physics Publishing. The Journal's web site is located at http://www.iop.org/Journals/jpcm
Citation
Journal Of Physics Condensed Matter, 2002, v. 14 n. 6, p. 1231-1236 How to Cite?
DOI: http://dx.doi.org/10.1088/0953-8984/14/6/310
AbstractThe symmetrized data acquisition method for producing artifact-free Patterson functions from low-energy electron diffraction (LEED) IV spectra was analyzed. The far-field approximation was used to write the diffracted intensities of PFs. The non-straight-through multiple-scattering events were found to cause the artifacts in the LEED PFs. Analysis showed that full beam sets at multiple incidence angles were necessary for the recovery of an artifact-free PF in the presence of multiple scattering.
Persistent Identifierhttp://hdl.handle.net/10722/80606
ISSN
0953-8984
2021 Impact Factor: 2.745
2020 SCImago Journal Rankings: 0.908
ISI Accession Number ID
WOS:000174332000017
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorTong, SYen_HK
dc.contributor.authorWu, Hen_HK
dc.date.accessioned2010-09-06T08:08:18Z-
dc.date.available2010-09-06T08:08:18Z-
dc.date.issued2002en_HK
dc.identifier.citationJournal Of Physics Condensed Matter, 2002, v. 14 n. 6, p. 1231-1236en_HK
dc.identifier.issn0953-8984en_HK
dc.identifier.urihttp://hdl.handle.net/10722/80606-
dc.description.abstractThe symmetrized data acquisition method for producing artifact-free Patterson functions from low-energy electron diffraction (LEED) IV spectra was analyzed. The far-field approximation was used to write the diffracted intensities of PFs. The non-straight-through multiple-scattering events were found to cause the artifacts in the LEED PFs. Analysis showed that full beam sets at multiple incidence angles were necessary for the recovery of an artifact-free PF in the presence of multiple scattering.en_HK
dc.languageengen_HK
dc.publisherInstitute of Physics Publishing. The Journal's web site is located at http://www.iop.org/Journals/jpcmen_HK
dc.relation.ispartofJournal of Physics Condensed Matteren_HK
dc.titleDirect inversion of low-energy electron diffraction (LEED) IV spectra: The surface Patterson functionen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0953-8984&volume=14&spage=1231&epage=1236&date=2002&atitle=Direct+inversion+of+low-energy+electron+diffraction+(LEED)+IV+spectra:+the+surface+Patterson+functionen_HK
dc.identifier.emailWu, H: hswu@hkucc.hku.hken_HK
dc.identifier.authorityWu, H=rp00813en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1088/0953-8984/14/6/310en_HK
dc.identifier.scopuseid_2-s2.0-0037127632en_HK
dc.identifier.hkuros77067en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0037127632&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume14en_HK
dc.identifier.issue6en_HK
dc.identifier.spage1231en_HK
dc.identifier.epage1236en_HK
dc.identifier.isiWOS:000174332000017-
dc.publisher.placeUnited Kingdomen_HK
dc.identifier.scopusauthoridTong, SY=24512624800en_HK
dc.identifier.scopusauthoridWu, H=7405584367en_HK
dc.identifier.issnl0953-8984-

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