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Article: Origin of the checkerboard pattern in scanning tunneling microscopy maps of underdoped cuprate superconductors

TitleOrigin of the checkerboard pattern in scanning tunneling microscopy maps of underdoped cuprate superconductors
Authors
Yang, KYChen, WQRice, TMZhang, FC
KeywordsPhysics
Issue Date2009
PublisherAmerican Physical Society. The Journal's web site is located at http://prb.aps.org/
Citation
Physical Review B (Condensed Matter and Materials Physics), 2009, v. 80 n. 17, article no. 174505 How to Cite?
DOI: http://dx.doi.org/10.1103/PhysRevB.80.174505
AbstractThe checkerboard pattern in the differential conductance maps on underdoped cuprates appears when the scanning tunneling microscopy is placed above the O sites in the outermost CuO2 plane. In this position the interference between tunneling paths through the apical ions above the neighboring Cu sites leads to an asymmetric weighting of final states in the two antinodal regions of k space. The form of the asymmetry in the differential conductance spectra in the checkerboard pattern favors asymmetry in the localization length rather than a nematic displacement as the underlying origin. © 2009 The American Physical Society.
Persistent Identifierhttp://hdl.handle.net/10722/80559
ISSN
1098-0121
2014 Impact Factor: 3.736
ISI Accession Number ID
WOS:000272310400076
Funding AgencyGrant Number
National Science FoundationPHY0551164
Funding Information:

We are very grateful to J. C. S. Davis and Y. Kohsaka for permission to reproduce their STM data and Y. Chen for stimulating discussions. Support from the MANEP program of the Swiss National funds ~ K.-Y. Y. and T. M. R. ~, and RGC grant of HKSAR (W.-Q. Chen and F. C. Z.) is gratefully acknowledged. This research was supported in part by the National Science Foundation under Grant No. PHY0551164.

References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorYang, KYen_HK
dc.contributor.authorChen, WQen_HK
dc.contributor.authorRice, TMen_HK
dc.contributor.authorZhang, FCen_HK
dc.date.accessioned2010-09-06T08:07:46Z-
dc.date.available2010-09-06T08:07:46Z-
dc.date.issued2009en_HK
dc.identifier.citationPhysical Review B (Condensed Matter and Materials Physics), 2009, v. 80 n. 17, article no. 174505-
dc.identifier.issn1098-0121en_HK
dc.identifier.urihttp://hdl.handle.net/10722/80559-
dc.description.abstractThe checkerboard pattern in the differential conductance maps on underdoped cuprates appears when the scanning tunneling microscopy is placed above the O sites in the outermost CuO2 plane. In this position the interference between tunneling paths through the apical ions above the neighboring Cu sites leads to an asymmetric weighting of final states in the two antinodal regions of k space. The form of the asymmetry in the differential conductance spectra in the checkerboard pattern favors asymmetry in the localization length rather than a nematic displacement as the underlying origin. © 2009 The American Physical Society.en_HK
dc.languageengen_HK
dc.publisherAmerican Physical Society. The Journal's web site is located at http://prb.aps.org/en_HK
dc.relation.ispartofPhysical Review B (Condensed Matter and Materials Physics)-
dc.rightsCopyright 2009 by The American Physical Society. This article is available online at https://doi.org/10.1103/PhysRevB.80.174505-
dc.subjectPhysics-
dc.titleOrigin of the checkerboard pattern in scanning tunneling microscopy maps of underdoped cuprate superconductorsen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=1098-0121&volume=80&issue=17 article no. 174505&spage=&epage=&date=2009&atitle=Origin+of+the+checkerboard+pattern+in+scanning+tunneling+microscopy+maps+of+underdoped+cuprate+superconductorsen_HK
dc.identifier.emailChen, WQ: wqchen@hku.hken_HK
dc.identifier.emailZhang, FC: fuchun@hkucc.hku.hken_HK
dc.identifier.authorityChen, WQ=rp00673en_HK
dc.identifier.authorityZhang, FC=rp00840en_HK
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1103/PhysRevB.80.174505en_HK
dc.identifier.scopuseid_2-s2.0-72949116542en_HK
dc.identifier.hkuros169463en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-72949116542&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume80en_HK
dc.identifier.issue17en_HK
dc.identifier.spagearticle no. 174505-
dc.identifier.epagearticle no. 174505-
dc.identifier.isiWOS:000272310400076-
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridYang, KY=7404291063en_HK
dc.identifier.scopusauthoridChen, WQ=36077405600en_HK
dc.identifier.scopusauthoridRice, TM=7201893707en_HK
dc.identifier.scopusauthoridZhang, FC=14012468800en_HK
dc.identifier.issnl1098-0121-

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