File Download

There are no files associated with this item.

  Links for fulltext
     (May Require Subscription)
Supplementary

Article: Hierarchical slice contours for layered-manufacturing

TitleHierarchical slice contours for layered-manufacturing
Authors
KeywordsLayered manufacturing
Multiple-inclusion contours
Slicing
Topological hierarchy
Virtual prototyping
Issue Date2002
PublisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/compind
Citation
Computers In Industry, 2002, v. 48 n. 3, p. 219-239 How to Cite?
AbstractThis paper proposes a contour-processing system to enhance the capability and efficiency of fabricating complex objects in layered manufacturing (LM). It consists of a tolerant slicing algorithm and a topological hierarchy-sorting algorithm. The tolerant slicing algorithm aims to overcome the constraints of computer memory and the computation instability commonly inherent in conventional slicing methodologies, while the topological hierarchy-sorting algorithm constructs the topological relationship of complex slice contours. The tolerant slicing algorithm adopts a simple pick-and-drop approach to minimise the memory usage. It extracts one facet at a time for slicing. Hence, complex and large STL models of virtually unlimited file size can be sliced effectively. The algorithm is relatively fault tolerant in that inconsistent contours due to defects of the STL file may be automatically repaired. The topological hierarchy-sorting algorithm constructs the hierarchy relationship of complex slice contours, with which virtual prototyping and surface reconstruction algorithms can be conveniently applied. In particular, slice contours with established hierarchy relationship facilitate collision detection in multi-material assemblies, as well as the optimisation of laser/binder path in LM by avoiding redundant back-and-forth movement. © 2002 Elsevier Science B.V. All rights reserved.
Persistent Identifierhttp://hdl.handle.net/10722/74373
ISSN
2023 Impact Factor: 8.2
2023 SCImago Journal Rankings: 2.453
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorChoi, SHen_HK
dc.contributor.authorKwok, KTen_HK
dc.date.accessioned2010-09-06T07:00:41Z-
dc.date.available2010-09-06T07:00:41Z-
dc.date.issued2002en_HK
dc.identifier.citationComputers In Industry, 2002, v. 48 n. 3, p. 219-239en_HK
dc.identifier.issn0166-3615en_HK
dc.identifier.urihttp://hdl.handle.net/10722/74373-
dc.description.abstractThis paper proposes a contour-processing system to enhance the capability and efficiency of fabricating complex objects in layered manufacturing (LM). It consists of a tolerant slicing algorithm and a topological hierarchy-sorting algorithm. The tolerant slicing algorithm aims to overcome the constraints of computer memory and the computation instability commonly inherent in conventional slicing methodologies, while the topological hierarchy-sorting algorithm constructs the topological relationship of complex slice contours. The tolerant slicing algorithm adopts a simple pick-and-drop approach to minimise the memory usage. It extracts one facet at a time for slicing. Hence, complex and large STL models of virtually unlimited file size can be sliced effectively. The algorithm is relatively fault tolerant in that inconsistent contours due to defects of the STL file may be automatically repaired. The topological hierarchy-sorting algorithm constructs the hierarchy relationship of complex slice contours, with which virtual prototyping and surface reconstruction algorithms can be conveniently applied. In particular, slice contours with established hierarchy relationship facilitate collision detection in multi-material assemblies, as well as the optimisation of laser/binder path in LM by avoiding redundant back-and-forth movement. © 2002 Elsevier Science B.V. All rights reserved.en_HK
dc.languageengen_HK
dc.publisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/compinden_HK
dc.relation.ispartofComputers in Industryen_HK
dc.rightsComputers in Industry. Copyright © Elsevier BV.en_HK
dc.subjectLayered manufacturingen_HK
dc.subjectMultiple-inclusion contoursen_HK
dc.subjectSlicingen_HK
dc.subjectTopological hierarchyen_HK
dc.subjectVirtual prototypingen_HK
dc.titleHierarchical slice contours for layered-manufacturingen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0166-3615&volume=48&issue=3&spage=219&epage=239&date=2002&atitle=Hierarchical+slice+contours+for+layered-manufacturingen_HK
dc.identifier.emailChoi, SH:shchoi@hkucc.hku.hken_HK
dc.identifier.authorityChoi, SH=rp00109en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/S0166-3615(02)00040-4en_HK
dc.identifier.scopuseid_2-s2.0-0036706552en_HK
dc.identifier.hkuros80515en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0036706552&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume48en_HK
dc.identifier.issue3en_HK
dc.identifier.spage219en_HK
dc.identifier.epage239en_HK
dc.identifier.isiWOS:000177033000003-
dc.publisher.placeNetherlandsen_HK
dc.identifier.scopusauthoridChoi, SH=7408119615en_HK
dc.identifier.scopusauthoridKwok, KT=7102194326en_HK
dc.identifier.issnl0166-3615-

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats