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Article: Use of confocal and multiphoton microscopy for the evaluation of micro-optical components and emitters

TitleUse of confocal and multiphoton microscopy for the evaluation of micro-optical components and emitters
Authors
KeywordsGaN LEDs
Micro-LED arrays
Micro-lens arrays
Issue Date2004
PublisherJohn Wiley & Sons, Inc. The Journal's web site is located at http://www.interscience.wiley.com/jpages/1059-910X/
Citation
Microscopy Research And Technique, 2004, v. 64 n. 4, p. 293-296 How to Cite?
AbstractWe report on the application of confocal and multiphoton microscopic techniques for the evaluation of the latest generation of micro optical components. The optical emitting characteristics of arrays of matrix addressable GaN micrometer-sized light emitting diodes (micro-LEDs) have been measured using a commercial confocal microscope utilising the LEDs' own emission along with reflection confocal microscopy to determine the surface structure. Multiphoton induced luminescence from the 10-20-micron diameter emitters has also been used to examine the structure of the device and we compare this with electrically induced emission. In related work, the optical properties of micro lens arrays (10-100-micron diameter) fabricated in SiC, Sapphire, and Diamond have been determined using transmission confocal microscopy. Such optical microscopy techniques offer a simple, non-destructive method to determine the structure and performance of such novel devices. © 2004 Wiley-Liss, Inc.
Persistent Identifierhttp://hdl.handle.net/10722/73919
ISSN
2023 Impact Factor: 2.0
2023 SCImago Journal Rankings: 0.438
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorGirkin, JMen_HK
dc.contributor.authorGu, Een_HK
dc.contributor.authorGriffin, Cen_HK
dc.contributor.authorChoi, HWen_HK
dc.contributor.authorDawson, MDen_HK
dc.contributor.authorMcConnell, Gen_HK
dc.date.accessioned2010-09-06T06:56:02Z-
dc.date.available2010-09-06T06:56:02Z-
dc.date.issued2004en_HK
dc.identifier.citationMicroscopy Research And Technique, 2004, v. 64 n. 4, p. 293-296en_HK
dc.identifier.issn1059-910Xen_HK
dc.identifier.urihttp://hdl.handle.net/10722/73919-
dc.description.abstractWe report on the application of confocal and multiphoton microscopic techniques for the evaluation of the latest generation of micro optical components. The optical emitting characteristics of arrays of matrix addressable GaN micrometer-sized light emitting diodes (micro-LEDs) have been measured using a commercial confocal microscope utilising the LEDs' own emission along with reflection confocal microscopy to determine the surface structure. Multiphoton induced luminescence from the 10-20-micron diameter emitters has also been used to examine the structure of the device and we compare this with electrically induced emission. In related work, the optical properties of micro lens arrays (10-100-micron diameter) fabricated in SiC, Sapphire, and Diamond have been determined using transmission confocal microscopy. Such optical microscopy techniques offer a simple, non-destructive method to determine the structure and performance of such novel devices. © 2004 Wiley-Liss, Inc.en_HK
dc.languageengen_HK
dc.publisherJohn Wiley & Sons, Inc. The Journal's web site is located at http://www.interscience.wiley.com/jpages/1059-910X/en_HK
dc.relation.ispartofMicroscopy Research and Techniqueen_HK
dc.rightsMicroscopy Research and Technique. Copyright © John Wiley & Sons, Inc.en_HK
dc.subjectGaN LEDsen_HK
dc.subjectMicro-LED arraysen_HK
dc.subjectMicro-lens arraysen_HK
dc.titleUse of confocal and multiphoton microscopy for the evaluation of micro-optical components and emittersen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=1059-910X&volume=64&spage=293&epage=&date=2004&atitle=Use+of+Confocal+and+Multiphoton+Microscopy+for+the+Evaluation+of+Micro-optical+Components+and+Emittersen_HK
dc.identifier.emailChoi, HW:hwchoi@eee.hku.hken_HK
dc.identifier.authorityChoi, HW=rp00108en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1002/jemt.20085en_HK
dc.identifier.scopuseid_2-s2.0-7544245941en_HK
dc.identifier.hkuros109860en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-7544245941&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume64en_HK
dc.identifier.issue4en_HK
dc.identifier.spage293en_HK
dc.identifier.epage296en_HK
dc.identifier.isiWOS:000224912900002-
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridGirkin, JM=6701651108en_HK
dc.identifier.scopusauthoridGu, E=7004420026en_HK
dc.identifier.scopusauthoridGriffin, C=8732304400en_HK
dc.identifier.scopusauthoridChoi, HW=7404334877en_HK
dc.identifier.scopusauthoridDawson, MD=7203061779en_HK
dc.identifier.scopusauthoridMcConnell, G=7004466744en_HK
dc.identifier.issnl1059-910X-

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