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Article: Characterization of block copolymers using scanning probe microscopy

TitleCharacterization of block copolymers using scanning probe microscopy
Authors
Djurisic, ABWang, HChan, WKXie, MH
KeywordsAtomic Force Microscopy
Phase Contrast
Block Copolymers
Diblock Copolymers
Phase Separation
Issue Date2006
PublisherAmerican Scientific Publishers. The Journal's web site is located at http://www.aspbs.com/jamr/
Citation
Journal of Scanning Probe Microscopy, 2006, v. 1 n. 1, p. 21-31 How to Cite?
DOI: http://dx.doi.org/10.1166/jspm.2006.001
AbstractBlock copolymers have attracted lots of attention in recent years for various nanoscience and nanotechnology applications. One common technique for characterization of block copolymer thin films is scanning probe microscopy. In this paper, we provide an overview of the use of scanning probe microscopy to study phase separation in block copolymer films. The use of topography and phase-contrast modes of atomic force microscopy for characterization of block copolymers are described in detail. The dependence of the phase image on the scanning parameters (e.g., the repulsive versus attractive regimes) as well as the settings of the microscope and the height variation in the sample are also discussed.
Persistent Identifierhttp://hdl.handle.net/10722/69287
ISSN
1557-7937

 

DC FieldValueLanguage
dc.contributor.authorDjurisic, ABen_HK
dc.contributor.authorWang, Hen_HK
dc.contributor.authorChan, WKen_HK
dc.contributor.authorXie, MHen_HK
dc.date.accessioned2010-09-06T06:12:16Z-
dc.date.available2010-09-06T06:12:16Z-
dc.date.issued2006en_HK
dc.identifier.citationJournal of Scanning Probe Microscopy, 2006, v. 1 n. 1, p. 21-31en_HK
dc.identifier.issn1557-7937en_HK
dc.identifier.urihttp://hdl.handle.net/10722/69287-
dc.description.abstractBlock copolymers have attracted lots of attention in recent years for various nanoscience and nanotechnology applications. One common technique for characterization of block copolymer thin films is scanning probe microscopy. In this paper, we provide an overview of the use of scanning probe microscopy to study phase separation in block copolymer films. The use of topography and phase-contrast modes of atomic force microscopy for characterization of block copolymers are described in detail. The dependence of the phase image on the scanning parameters (e.g., the repulsive versus attractive regimes) as well as the settings of the microscope and the height variation in the sample are also discussed.-
dc.languageengen_HK
dc.publisherAmerican Scientific Publishers. The Journal's web site is located at http://www.aspbs.com/jamr/en_HK
dc.relation.ispartofJournal of Scanning Probe Microscopyen_HK
dc.subjectAtomic Force Microscopy-
dc.subjectPhase Contrast-
dc.subjectBlock Copolymers-
dc.subjectDiblock Copolymers-
dc.subjectPhase Separation-
dc.titleCharacterization of block copolymers using scanning probe microscopyen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=1557-7937&volume=1&spage=21&epage=31&date=2006&atitle=Characterization+of+block+copolymers+using+scanning+probe+microscopyen_HK
dc.identifier.emailDjurisic, AB: dalek@hku.hken_HK
dc.identifier.emailChan, WK: waichan@hku.hken_HK
dc.identifier.emailXie, MH: mhxie@hku.hken_HK
dc.identifier.authorityDjurisic, A=rp00690en_HK
dc.identifier.authorityChan, WK=rp00667en_HK
dc.identifier.authorityXie, MH=rp00818en_HK
dc.identifier.doi10.1166/jspm.2006.001-
dc.identifier.hkuros127092en_HK
dc.identifier.volume1-
dc.identifier.issue1-
dc.identifier.spage21-
dc.identifier.epage31-
dc.publisher.placeUnited States-
dc.identifier.issnl1557-7937-

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