Showing results 1 to 3 of 3
Title | Author(s) | Issue Date | |
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A cumulative count control chart for Poisson process Proceeding/Conference:The 4th International Applied Statistics in Industry Conference, Kansas City, U.S.A., 3-5 June, 1997 | 1997 | ||
A new control chart for high yield processes Proceeding/Conference:ISSAT International Conference on Reliability and Quality in Design | 1997 | ||
Some procedures for charting high performance manufacturing processes Proceeding/Conference:Technology for Manufacturing Conference, Palmerston North, New Zealand, 12-13 February, 1997 | 1997 |