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Conference Paper: An automatic test data generation system based on the integrated classification-tree methodology

TitleAn automatic test data generation system based on the integrated classification-tree methodology
Authors
Cain, AChen, TYGrant, DPoon, PLTang, SFTse, TH
KeywordsAutomatic test case generation
Black box testing
Category-partition method
Choice relation framework
Classification-tree method
Software testing
Issue Date2004
PublisherSpringer Verlag. The Journal's web site is located at https://link.springer.com/conference/sera
Citation
1st International Conference on Software Engineering Research and Applications (SERA) 2003, San Francisco, CA, USA, 25-27 June 2003. Selected Revised Papers in Ramamoorthy, CV; Lee, RY & Lee, KW (eds.), Software Engineering Research and Applications (SERA) 2003, p. 225-238 How to Cite?
DOI: http://dx.doi.org/10.1007/978-3-540-24675-6_18
AbstractGrochtmann and Grimm have developed the classification-tree method (CTM) to facilitate software testers in generating test cases from functional specifications. While the method is very useful, it is hindered by the lack of a systematic tree construction algorithm. This problem has been alleviated by Chen et al. via their "integrated" classification-tree methodology (ICTM). In this paper, we describe and discuss a prototype system ADDICT that is built on ICTM. © Springer-Verlag 2004.
Persistent Identifierhttp://hdl.handle.net/10722/43692
ISBN
978-3-540-21975-0
ISSN
0302-9743
2020 SCImago Journal Rankings: 0.249
ISI Accession Number ID
WOS:000221907100018
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorCain, Aen_HK
dc.contributor.authorChen, TYen_HK
dc.contributor.authorGrant, Den_HK
dc.contributor.authorPoon, PLen_HK
dc.contributor.authorTang, SFen_HK
dc.contributor.authorTse, THen_HK
dc.date.accessioned2007-03-23T04:52:33Z-
dc.date.available2007-03-23T04:52:33Z-
dc.date.issued2004en_HK
dc.identifier.citation1st International Conference on Software Engineering Research and Applications (SERA) 2003, San Francisco, CA, USA, 25-27 June 2003. Selected Revised Papers in Ramamoorthy, CV; Lee, RY & Lee, KW (eds.), Software Engineering Research and Applications (SERA) 2003, p. 225-238en_HK
dc.identifier.isbn978-3-540-21975-0en_HK
dc.identifier.issn0302-9743en_HK
dc.identifier.urihttp://hdl.handle.net/10722/43692-
dc.description.abstractGrochtmann and Grimm have developed the classification-tree method (CTM) to facilitate software testers in generating test cases from functional specifications. While the method is very useful, it is hindered by the lack of a systematic tree construction algorithm. This problem has been alleviated by Chen et al. via their "integrated" classification-tree methodology (ICTM). In this paper, we describe and discuss a prototype system ADDICT that is built on ICTM. © Springer-Verlag 2004.en_HK
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dc.format.extent161620 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/pdf-
dc.languageengen_HK
dc.publisherSpringer Verlag. The Journal's web site is located at https://link.springer.com/conference/seraen_HK
dc.relation.ispartof1st International Conference on Software Engineering Research and Applications (SERA) 2003 proceedingsen_HK
dc.rightsThe final authenticated version is available online at https://doi.org/10.1007/978-3-540-24675-6_18en_HK
dc.subjectAutomatic test case generationen_HK
dc.subjectBlack box testingen_HK
dc.subjectCategory-partition methoden_HK
dc.subjectChoice relation frameworken_HK
dc.subjectClassification-tree methoden_HK
dc.subjectSoftware testingen_HK
dc.titleAn automatic test data generation system based on the integrated classification-tree methodologyen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailTse, TH: thtse@cs.hku.hken_HK
dc.identifier.email238-
dc.identifier.authorityTse, TH=rp00546en_HK
dc.description.naturepostprinten_HK
dc.identifier.doi10.1007/978-3-540-24675-6_18en_HK
dc.identifier.scopuseid_2-s2.0-35048894961en_HK
dc.identifier.hkuros86413-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-35048894961&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.spage225en_HK
dc.identifier.epage238en_HK
dc.identifier.isiWOS:000221907100018-
dc.publisher.placeGermanyen_HK
dc.identifier.scopusauthoridCain, A=24922997900en_HK
dc.identifier.scopusauthoridChen, TY=13104290200en_HK
dc.identifier.scopusauthoridGrant, D=7402310303en_HK
dc.identifier.scopusauthoridPoon, PL=7101925990en_HK
dc.identifier.scopusauthoridTang, SF=7403437100en_HK
dc.identifier.scopusauthoridTse, TH=7005496974en_HK
dc.identifier.issnl0302-9743-

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