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Article: 360-deg profilometry: new techniques for display and acquisition

Title360-deg profilometry: new techniques for display and acquisition
Authors
KeywordsProfiometry
Logical moire
Phase shifting
Scanning moire structured light
Projected gratings
Issue Date1994
PublisherS P I E - International Society for Optical Engineering. The Journal's web site is located at http://www.spie.org/oe
Citation
Optical Engineering, 1994, v. 33 n. 8, p. 2760-2769 How to Cite?
AbstractTwo optical methods are proposed for shape measurement and defect detection of curved surfaces in the form of a complete 360- deg profile of the object. The first one is the standard structured light approach. Display of the resulting data is the emphasis of this section. The second approach uses modulated structured light with a scanning digital camera for faster and simpler data acquisition. Quantitative processing is done off-line while real-time moire produces enhanced display of the defects for qualitative analysis.
Persistent Identifierhttp://hdl.handle.net/10722/42403
ISSN
2017 Impact Factor: 0.993
2015 SCImago Journal Rankings: 0.485
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorAsundi, Aen_HK
dc.contributor.authorChan, CSen_HK
dc.contributor.authorSajan, MRen_HK
dc.date.accessioned2007-01-29T08:49:05Z-
dc.date.available2007-01-29T08:49:05Z-
dc.date.issued1994en_HK
dc.identifier.citationOptical Engineering, 1994, v. 33 n. 8, p. 2760-2769en_HK
dc.identifier.issn0091-3286en_HK
dc.identifier.urihttp://hdl.handle.net/10722/42403-
dc.description.abstractTwo optical methods are proposed for shape measurement and defect detection of curved surfaces in the form of a complete 360- deg profile of the object. The first one is the standard structured light approach. Display of the resulting data is the emphasis of this section. The second approach uses modulated structured light with a scanning digital camera for faster and simpler data acquisition. Quantitative processing is done off-line while real-time moire produces enhanced display of the defects for qualitative analysis.en_HK
dc.format.extent1102314 bytes-
dc.format.extent25088 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/msword-
dc.languageengen_HK
dc.publisherS P I E - International Society for Optical Engineering. The Journal's web site is located at http://www.spie.org/oeen_HK
dc.relation.ispartofOptical Engineering-
dc.rightsCopyright 1994 Society of Photo‑Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, and modification of the contents of the publication are prohibited. This article is available online at https://doi.org/10.1117/12.176507-
dc.subjectProfiometryen_HK
dc.subjectLogical moireen_HK
dc.subjectPhase shiftingen_HK
dc.subjectScanning moire structured lighten_HK
dc.subjectProjected gratingsen_HK
dc.title360-deg profilometry: new techniques for display and acquisitionen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0091-3286&volume=33&issue=8&spage=2760&epage=2769&date=1994&atitle=360-deg+profilometry:+new+techniques+for+display+and+acquisitionen_HK
dc.description.naturepublished_or_final_versionen_HK
dc.identifier.doi10.1117/12.176507-
dc.identifier.scopuseid_2-s2.0-0028493516-
dc.identifier.hkuros2133-
dc.identifier.volume33-
dc.identifier.issue8-
dc.identifier.spage2760-
dc.identifier.epage2769-
dc.identifier.isiWOS:A1994PB29900039-

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