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Title | Author(s) | Issue Date | |
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Back-gate bias dependence of the statistical variability of FDSOI MOSFETs with thin BOX Journal:IEEE Transactions on Electron Devices | 2013 |
Title | Author(s) | Issue Date | |
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Back-gate bias dependence of the statistical variability of FDSOI MOSFETs with thin BOX Journal:IEEE Transactions on Electron Devices | 2013 |