Showing results 2 to 3 of 3
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Title | Author(s) | Issue Date | |
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Lifetime prediction of electronic devices based on the P-stacking machine learning model Journal:Microelectronics Reliability | 1-Jul-2024 | ||
Telerobotic systems adaptive to the quality of its operators Proceeding/Conference:3rd Int. Joint Topical Meeting on Emergency Preparedness and Response and Robotics and Remote Systems 2011, EPRRSD, and 13th Robotics and Remote Systems for Hazardous Environments | 2011 |