Showing results 1 to 3 of 3
Title | Author(s) | Issue Date | |
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Correlation between hot-carrier-induced interface states and GIDL current increase in N-MOSFET's Journal:IEEE Transactions on Electron Devices | 1998 | ||
2007 | |||
Rodent EAE model for the study of axon integrity and remyelination Journal:Protocol Exchange | 2007 |