Showing results 1 to 5 of 5
Title | Author(s) | Issue Date | Views | |
---|---|---|---|---|
Accurate phase capacitance spectroscopy of transition metal silicon diodes Journal:Applied Physics Letters | 1985 | |||
Electronic states at silicide-silicon interfaces Journal:Physical Review Letters | 1986 | 113 | ||
Measurement of interface states in palladium silicon diodes Journal:Journal of Applied Physics | 1986 | |||
Metal-amorphous silicon-silicon tunnel rectifier Journal:Applied Physics Letters | 1984 | 127 | ||
Schottky barrier, electronic states and microstructure at Ni silicide-silicon interfaces Journal:Surface Science | 1986 | 121 |