Showing results 1 to 3 of 3
Title | Author(s) | Issue Date | |
---|---|---|---|
Analytical Post-Voiding Modeling and Efficient Characterization of EM Failure Effects Under Time-Dependent Current Stressing Journal:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 7-Jun-2023 | ||
FAT: Frequency-Aware Transformation for Bridging Full-Precision and Low-Precision Deep Representations Journal:IEEE Transactions on Neural Networks and Learning Systems | 21-Oct-2022 | ||
Multilayer Perceptron-Based Stress Evolution Analysis Under DC Current Stressing for Multisegment Wires Journal:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 1-Feb-2023 |