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Title | Author(s) | Issue Date | Views | |
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Burnout and gate rupture of power MOS transistors with fission fragments of 252Cf Journal:Yuanzineng Kexue Jishu/Atomic Energy Science and Technology | 2000 |
Title | Author(s) | Issue Date | Views | |
---|---|---|---|---|
Burnout and gate rupture of power MOS transistors with fission fragments of 252Cf Journal:Yuanzineng Kexue Jishu/Atomic Energy Science and Technology | 2000 |