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- Publisher Website: 10.1109/JSTQE.2016.2625046
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Article: Reconstruction of Nanoscale Near Fields by Attosecond Streaking
| Title | Reconstruction of Nanoscale Near Fields by Attosecond Streaking |
|---|---|
| Authors | |
| Keywords | nanotechnology near fields Ultrafast optics |
| Issue Date | 2017 |
| Citation | IEEE Journal of Selected Topics in Quantum Electronics, 2017, v. 23, n. 3, p. 77-87 How to Cite? |
| Abstract | Recent advances in attosecond science in combination with the well-established techniques of nanofabrication have led to the new research field of attosecond nanophysics. One central goal is the characterization and manipulation of electromagnetic fields on the attosecond and nanometer scale. This has so far remained challenging both theoretically and experimentally. One major obstacle is the inhomogeneity of the electric fields. We present a general model below, which allows the description of attosecond streaking in near fields. It allows the classification into different regimes as well as the reconstruction of the electric fields at the surface. In addition, we discuss the case of parallel polarization of the streaking fields to the surface, which has so far not been considered for attosecond streaking from metallic surfaces. Finally, we review recent measurements of the electric field and response function of a gold nanotaper. Our results are highly relevant for future attosecond streaking experiments in inhomogeneous fields. |
| Persistent Identifier | http://hdl.handle.net/10722/365017 |
| ISSN | 2023 Impact Factor: 4.3 2023 SCImago Journal Rankings: 1.283 |
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Schotz, Johannes | - |
| dc.contributor.author | Forg, Benjamin | - |
| dc.contributor.author | Forster, Michael | - |
| dc.contributor.author | Okell, William A. | - |
| dc.contributor.author | Stockman, Mark I. | - |
| dc.contributor.author | Krausz, Ferenc | - |
| dc.contributor.author | Hommelhoff, Peter | - |
| dc.contributor.author | Kling, Matthias F. | - |
| dc.date.accessioned | 2025-10-30T08:36:32Z | - |
| dc.date.available | 2025-10-30T08:36:32Z | - |
| dc.date.issued | 2017 | - |
| dc.identifier.citation | IEEE Journal of Selected Topics in Quantum Electronics, 2017, v. 23, n. 3, p. 77-87 | - |
| dc.identifier.issn | 1077-260X | - |
| dc.identifier.uri | http://hdl.handle.net/10722/365017 | - |
| dc.description.abstract | Recent advances in attosecond science in combination with the well-established techniques of nanofabrication have led to the new research field of attosecond nanophysics. One central goal is the characterization and manipulation of electromagnetic fields on the attosecond and nanometer scale. This has so far remained challenging both theoretically and experimentally. One major obstacle is the inhomogeneity of the electric fields. We present a general model below, which allows the description of attosecond streaking in near fields. It allows the classification into different regimes as well as the reconstruction of the electric fields at the surface. In addition, we discuss the case of parallel polarization of the streaking fields to the surface, which has so far not been considered for attosecond streaking from metallic surfaces. Finally, we review recent measurements of the electric field and response function of a gold nanotaper. Our results are highly relevant for future attosecond streaking experiments in inhomogeneous fields. | - |
| dc.language | eng | - |
| dc.relation.ispartof | IEEE Journal of Selected Topics in Quantum Electronics | - |
| dc.subject | nanotechnology | - |
| dc.subject | near fields | - |
| dc.subject | Ultrafast optics | - |
| dc.title | Reconstruction of Nanoscale Near Fields by Attosecond Streaking | - |
| dc.type | Article | - |
| dc.description.nature | link_to_subscribed_fulltext | - |
| dc.identifier.doi | 10.1109/JSTQE.2016.2625046 | - |
| dc.identifier.scopus | eid_2-s2.0-85012900991 | - |
| dc.identifier.volume | 23 | - |
| dc.identifier.issue | 3 | - |
| dc.identifier.spage | 77 | - |
| dc.identifier.epage | 87 | - |
| dc.identifier.eissn | 1558-4542 | - |
