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- Publisher Website: 10.1073/pnas.1010165107
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Article: Single-electron pulses for ultrafast diffraction
| Title | Single-electron pulses for ultrafast diffraction |
|---|---|
| Authors | |
| Issue Date | 2010 |
| Citation | Proceedings of the National Academy of Sciences of the United States of America, 2010, v. 107, n. 46, p. 19714-19719 How to Cite? |
| Abstract | Visualization of atomic-scale structural motion by ultrafast electron diffraction and microscopy requires electron packets of shortest duration and highest coherence. We report on the generation and application of single-electron pulses for this purpose. Photoelectric emission from metal surfaces is studied with tunable ultraviolet pulses in the femtosecond regime. The bandwidth, efficiency, coherence, and electron pulse duration are investigated in dependence on excitation wavelength, intensity, and laser bandwidth. At photon energies close to the cathode's work function, the electron pulse duration shortens significantly and approaches a threshold that is determined by interplay of the optical pulse width and the acceleration field. An optimized choice of laser wavelength and bandwidth results in sub-100-fs electron pulses. We demonstrate single-electron diffraction from polycrystalline diamond films and reveal the favorable influences of matched photon energies on the coherence volume of single-electron wave packets. We discuss the consequences of our findings for the physics of the photoelectric effect and for applications of single-electron pulses in ultrafast 4D imaging of structural dynamics. |
| Persistent Identifier | http://hdl.handle.net/10722/364806 |
| ISSN | 2023 Impact Factor: 9.4 2023 SCImago Journal Rankings: 3.737 |
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Aidelsburger, M. | - |
| dc.contributor.author | Kirchner, F. O. | - |
| dc.contributor.author | Krausz, F. | - |
| dc.contributor.author | Baum, P. | - |
| dc.date.accessioned | 2025-10-30T08:35:32Z | - |
| dc.date.available | 2025-10-30T08:35:32Z | - |
| dc.date.issued | 2010 | - |
| dc.identifier.citation | Proceedings of the National Academy of Sciences of the United States of America, 2010, v. 107, n. 46, p. 19714-19719 | - |
| dc.identifier.issn | 0027-8424 | - |
| dc.identifier.uri | http://hdl.handle.net/10722/364806 | - |
| dc.description.abstract | Visualization of atomic-scale structural motion by ultrafast electron diffraction and microscopy requires electron packets of shortest duration and highest coherence. We report on the generation and application of single-electron pulses for this purpose. Photoelectric emission from metal surfaces is studied with tunable ultraviolet pulses in the femtosecond regime. The bandwidth, efficiency, coherence, and electron pulse duration are investigated in dependence on excitation wavelength, intensity, and laser bandwidth. At photon energies close to the cathode's work function, the electron pulse duration shortens significantly and approaches a threshold that is determined by interplay of the optical pulse width and the acceleration field. An optimized choice of laser wavelength and bandwidth results in sub-100-fs electron pulses. We demonstrate single-electron diffraction from polycrystalline diamond films and reveal the favorable influences of matched photon energies on the coherence volume of single-electron wave packets. We discuss the consequences of our findings for the physics of the photoelectric effect and for applications of single-electron pulses in ultrafast 4D imaging of structural dynamics. | - |
| dc.language | eng | - |
| dc.relation.ispartof | Proceedings of the National Academy of Sciences of the United States of America | - |
| dc.title | Single-electron pulses for ultrafast diffraction | - |
| dc.type | Article | - |
| dc.description.nature | link_to_subscribed_fulltext | - |
| dc.identifier.doi | 10.1073/pnas.1010165107 | - |
| dc.identifier.scopus | eid_2-s2.0-78650545124 | - |
| dc.identifier.volume | 107 | - |
| dc.identifier.issue | 46 | - |
| dc.identifier.spage | 19714 | - |
| dc.identifier.epage | 19719 | - |
| dc.identifier.eissn | 1091-6490 | - |
