File Download

There are no files associated with this item.

  Links for fulltext
     (May Require Subscription)
Supplementary

Article: Physical vapor transport growth of layered (3-In2Se3 nanoflakes: Investigation of morphological, Raman and photo detection characteristics

TitlePhysical vapor transport growth of layered (3-In2Se3 nanoflakes: Investigation of morphological, Raman and photo detection characteristics
Authors
Keywords2D materials
Optoelectronics
Photodetector
Physical vapor transport
Raman spectroscopy
Issue Date25-Jan-2025
PublisherElsevier
Citation
Optical Materials, 2025, v. 160, p. 1-8 How to Cite?
Abstract

In2Se3 nanostructures have received extensive attention due to their potential uses in phase change random access memory, field effect transistors, thermoelectric and optoelectronic devices. Few studies reported the direct growth of layered-In2Se3 on SiO2/Si substrate, and the reported flake size is less than 10 μm. In the present study, we have successfully grown large area β-In2Se3 layered flakes on mica and SiO2(300)/Si substrates by physical vapor transport (PVT) process. Morphology, structure, composition, thickness and phase characterizations have been carried out by using an optical microscope, scanning electron microscopy (SEM), EDX, atomic force microscopy (AFM) and Raman spectroscopy, respectively. The first order temperature coefficients of a strong Raman mode on mica and SiO2(300)/Si, respectively are calculated by employing temperature and power dependent Raman spectroscopy. A PVT grown β-In2Se3 based broadband optical detector showing a significant optical response from 405 nm to 830 nm was fabricated.


Persistent Identifierhttp://hdl.handle.net/10722/354758
ISSN
2023 Impact Factor: 3.8
2023 SCImago Journal Rankings: 0.647
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorKazmi, Syed Mesam Tamar-
dc.contributor.authorRashid, Rashad-
dc.contributor.authorLing, Francis Chi-Chung-
dc.contributor.authorAli, Zahid-
dc.contributor.authorRafiq, Muhammad Aftab-
dc.contributor.authorRaffi, Muhammad-
dc.date.accessioned2025-03-08T00:35:05Z-
dc.date.available2025-03-08T00:35:05Z-
dc.date.issued2025-01-25-
dc.identifier.citationOptical Materials, 2025, v. 160, p. 1-8-
dc.identifier.issn0925-3467-
dc.identifier.urihttp://hdl.handle.net/10722/354758-
dc.description.abstract<p>In<sub>2</sub>Se<sub>3</sub> nanostructures have received extensive attention due to their potential uses in phase change random access memory, field effect transistors, thermoelectric and optoelectronic devices. Few studies reported the direct growth of layered-In<sub>2</sub>Se<sub>3</sub> on SiO<sub>2</sub>/Si substrate, and the reported flake size is less than 10 μm. In the present study, we have successfully grown large area β-In<sub>2</sub>Se<sub>3</sub> layered flakes on mica and SiO<sub>2</sub>(300)/Si substrates by physical vapor transport (PVT) process. Morphology, structure, composition, thickness and phase characterizations have been carried out by using an optical microscope, scanning electron microscopy (SEM), EDX, atomic force microscopy (AFM) and Raman spectroscopy, respectively. The first order temperature coefficients of a strong Raman mode on mica and SiO<sub>2</sub>(300)/Si, respectively are calculated by employing temperature and power dependent Raman spectroscopy. A PVT grown β-In<sub>2</sub>Se<sub>3</sub> based broadband optical detector showing a significant optical response from 405 nm to 830 nm was fabricated.</p>-
dc.languageeng-
dc.publisherElsevier-
dc.relation.ispartofOptical Materials-
dc.subject2D materials-
dc.subjectOptoelectronics-
dc.subjectPhotodetector-
dc.subjectPhysical vapor transport-
dc.subjectRaman spectroscopy-
dc.titlePhysical vapor transport growth of layered (3-In2Se3 nanoflakes: Investigation of morphological, Raman and photo detection characteristics-
dc.typeArticle-
dc.identifier.doi10.1016/j.optmat.2025.116742-
dc.identifier.scopuseid_2-s2.0-85216308022-
dc.identifier.volume160-
dc.identifier.spage1-
dc.identifier.epage8-
dc.identifier.eissn1873-1252-
dc.identifier.isiWOS:001423752000001-
dc.identifier.issnl0925-3467-

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats