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Article: Chip Size Minimization for Wide and Ultrawide Bandgap Power Devices

TitleChip Size Minimization for Wide and Ultrawide Bandgap Power Devices
Authors
KeywordsChip size
codesign
drift region
packaging
power devices
power electronics
power loss
switching frequency
ultrawide bandgap
wide bandgap (WBG)
Issue Date2023
Citation
IEEE Transactions on Electron Devices, 2023, v. 70, n. 2, p. 633-639 How to Cite?
AbstractChip size (Achip) optimization is key to the accurate analysis of device and material costs and the design of multichip modules. It is particularly critical for wide bandgap (WBG) and ultrawide bandgap (UWBG) power devices due to high material cost. Moreover, the designs of Achip and the drift region thickness (Wdr) and doping concentration (Ndr) are interdependent, requiring their co-optimization. Current design practices for Achip, Wdr, and Ndr rely on optimizing electrical parameters. This work presents a new, holistic, electrothermal approach to optimize Achip for a given set of target specifications, including breakdownvoltage (BV), conductioncurrent (I0), and switching frequency (f ). The conduction and switching losses of the device are considered as well as the heat dissipation in the chip and its package. For a given BV and Io, the optimal Achip, Wdr, and Ndr show a strong dependence on f and thermal management. Such dependencies are missing in prior Achip design methods. This approach is applied to compare the optimal Achip of WBG and UWBG devices up to a BV over 10 kV and f of 1 MHz. Our approach offers more accurate cost analysis and design guidelines for power modules.
Persistent Identifierhttp://hdl.handle.net/10722/352344
ISSN
2023 Impact Factor: 2.9
2023 SCImago Journal Rankings: 0.785
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorWang, Boyan-
dc.contributor.authorXiao, Ming-
dc.contributor.authorZhang, Zichen-
dc.contributor.authorWang, Yifan-
dc.contributor.authorQin, Yuan-
dc.contributor.authorSong, Qihao-
dc.contributor.authorLu, Guo Quan-
dc.contributor.authorNgo, Khai-
dc.contributor.authorZhang, Yuhao-
dc.date.accessioned2024-12-16T03:58:22Z-
dc.date.available2024-12-16T03:58:22Z-
dc.date.issued2023-
dc.identifier.citationIEEE Transactions on Electron Devices, 2023, v. 70, n. 2, p. 633-639-
dc.identifier.issn0018-9383-
dc.identifier.urihttp://hdl.handle.net/10722/352344-
dc.description.abstractChip size (Achip) optimization is key to the accurate analysis of device and material costs and the design of multichip modules. It is particularly critical for wide bandgap (WBG) and ultrawide bandgap (UWBG) power devices due to high material cost. Moreover, the designs of Achip and the drift region thickness (Wdr) and doping concentration (Ndr) are interdependent, requiring their co-optimization. Current design practices for Achip, Wdr, and Ndr rely on optimizing electrical parameters. This work presents a new, holistic, electrothermal approach to optimize Achip for a given set of target specifications, including breakdownvoltage (BV), conductioncurrent (I0), and switching frequency (f ). The conduction and switching losses of the device are considered as well as the heat dissipation in the chip and its package. For a given BV and Io, the optimal Achip, Wdr, and Ndr show a strong dependence on f and thermal management. Such dependencies are missing in prior Achip design methods. This approach is applied to compare the optimal Achip of WBG and UWBG devices up to a BV over 10 kV and f of 1 MHz. Our approach offers more accurate cost analysis and design guidelines for power modules.-
dc.languageeng-
dc.relation.ispartofIEEE Transactions on Electron Devices-
dc.subjectChip size-
dc.subjectcodesign-
dc.subjectdrift region-
dc.subjectpackaging-
dc.subjectpower devices-
dc.subjectpower electronics-
dc.subjectpower loss-
dc.subjectswitching frequency-
dc.subjectultrawide bandgap-
dc.subjectwide bandgap (WBG)-
dc.titleChip Size Minimization for Wide and Ultrawide Bandgap Power Devices-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/TED.2022.3232309-
dc.identifier.scopuseid_2-s2.0-85147210720-
dc.identifier.volume70-
dc.identifier.issue2-
dc.identifier.spage633-
dc.identifier.epage639-
dc.identifier.eissn1557-9646-
dc.identifier.isiWOS:000910517900001-

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