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Article: Large-Area 1.2-kV GaN vertical power FinFETs with a record switching figure of merit

TitleLarge-Area 1.2-kV GaN vertical power FinFETs with a record switching figure of merit
Authors
Keywordsfigure of merits
FinFETs
Gallium nitride
junction capacitances
power switching
power transistors
switching charges
switching frequency
Issue Date2019
Citation
IEEE Electron Device Letters, 2019, v. 40, n. 1, p. 75-78 How to Cite?
AbstractThis letter presents the first experimental study on capacitances, charges, and power-switching figure of merits (FOM) for a large-area vertical GaN power transistor. A 1.2-kV, 5-A GaN vertical power FinFET was demonstrated in a chip area of 0.45 mm2, with a specific on-resistance of 2.1 mΩ·cm2 and a threshold voltage of 1.3 V. Device junction capacitances were characterized and their main components were identified. This was used to calculate the switching charges and practical switching frequencies. Device FOMs were then derived that take into account the trade-offs between the conduction and switching power losses. Our GaN vertical FinFETs exhibit high-frequency (MHz) switching capabilities and superior switching FOMs when compared with commercial 0.9-1.2-kV Si and SiC power transistors. This letter shows the great potential of GaN vertical FinFETs for next-generation medium-voltage power electronics.
Persistent Identifierhttp://hdl.handle.net/10722/352169
ISSN
2023 Impact Factor: 4.1
2023 SCImago Journal Rankings: 1.250

 

DC FieldValueLanguage
dc.contributor.authorZhang, Yuhao-
dc.contributor.authorSun, Min-
dc.contributor.authorPerozek, Josh-
dc.contributor.authorLiu, Zhihong-
dc.contributor.authorZubair, Ahmad-
dc.contributor.authorPiedra, Daniel-
dc.contributor.authorChowdhury, Nadim-
dc.contributor.authorGao, Xiang-
dc.contributor.authorShepard, Kenneth-
dc.contributor.authorPalacios, Tomas-
dc.date.accessioned2024-12-16T03:57:06Z-
dc.date.available2024-12-16T03:57:06Z-
dc.date.issued2019-
dc.identifier.citationIEEE Electron Device Letters, 2019, v. 40, n. 1, p. 75-78-
dc.identifier.issn0741-3106-
dc.identifier.urihttp://hdl.handle.net/10722/352169-
dc.description.abstractThis letter presents the first experimental study on capacitances, charges, and power-switching figure of merits (FOM) for a large-area vertical GaN power transistor. A 1.2-kV, 5-A GaN vertical power FinFET was demonstrated in a chip area of 0.45 mm2, with a specific on-resistance of 2.1 mΩ·cm2 and a threshold voltage of 1.3 V. Device junction capacitances were characterized and their main components were identified. This was used to calculate the switching charges and practical switching frequencies. Device FOMs were then derived that take into account the trade-offs between the conduction and switching power losses. Our GaN vertical FinFETs exhibit high-frequency (MHz) switching capabilities and superior switching FOMs when compared with commercial 0.9-1.2-kV Si and SiC power transistors. This letter shows the great potential of GaN vertical FinFETs for next-generation medium-voltage power electronics.-
dc.languageeng-
dc.relation.ispartofIEEE Electron Device Letters-
dc.subjectfigure of merits-
dc.subjectFinFETs-
dc.subjectGallium nitride-
dc.subjectjunction capacitances-
dc.subjectpower switching-
dc.subjectpower transistors-
dc.subjectswitching charges-
dc.subjectswitching frequency-
dc.titleLarge-Area 1.2-kV GaN vertical power FinFETs with a record switching figure of merit-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/LED.2018.2880306-
dc.identifier.scopuseid_2-s2.0-85056354265-
dc.identifier.volume40-
dc.identifier.issue1-
dc.identifier.spage75-
dc.identifier.epage78-

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