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Article: Identifying atomically thin isolated-band channels for intrinsic steep-slope transistors by high-throughput study

TitleIdentifying atomically thin isolated-band channels for intrinsic steep-slope transistors by high-throughput study
Authors
Keywords2D materials
DFT-NEGF calculations
Electronic band structures
Steep-slope transistors
Transport properties
Issue Date9-Mar-2024
PublisherElsevier
Citation
Science Bulletin, 2024, v. 69, n. 10, p. 1427-1436 How to Cite?
AbstractDeveloping low-power FETs holds significant importance in advancing logic circuits, especially as the feature size of MOSFETs approaches sub-10 nanometers. However, this has been restricted by the thermionic limitation of SS, which is limited to 60 mV per decade at room temperature. Herein, we proposed a strategy that utilizes 2D semiconductors with an isolated-band feature as channels to realize sub-thermionic SS in MOSFETs. Through high-throughput calculations, we established a guiding principle that combines the atomic structure and orbital interaction to identify their sub-thermionic transport potential. This guides us to screen 192 candidates from the 2D material database comprising 1608 systems. Additionally, the physical relationship between the sub-thermionic transport performances and electronic structures is further revealed, which enables us to predict 15 systems with promising device performances for low-power applications with supply voltage below 0.5 V. This work opens a new way for the low-power electronics based on 2D materials and would inspire extensive interests in the experimental exploration of intrinsic steep-slope MOSFETs.
Persistent Identifierhttp://hdl.handle.net/10722/351218
ISSN
2023 Impact Factor: 18.8
2023 SCImago Journal Rankings: 2.807

 

DC FieldValueLanguage
dc.contributor.authorQu, Hengze-
dc.contributor.authorZhang, Shengli-
dc.contributor.authorCao, Jiang-
dc.contributor.authorWu, Zhenhua-
dc.contributor.authorChai, Yang-
dc.contributor.authorLi, Weisheng-
dc.contributor.authorLi, Lain Jong-
dc.contributor.authorRen, Wencai-
dc.contributor.authorWang, Xinran-
dc.contributor.authorZeng, Haibo-
dc.date.accessioned2024-11-14T00:35:28Z-
dc.date.available2024-11-14T00:35:28Z-
dc.date.issued2024-03-09-
dc.identifier.citationScience Bulletin, 2024, v. 69, n. 10, p. 1427-1436-
dc.identifier.issn2095-9273-
dc.identifier.urihttp://hdl.handle.net/10722/351218-
dc.description.abstractDeveloping low-power FETs holds significant importance in advancing logic circuits, especially as the feature size of MOSFETs approaches sub-10 nanometers. However, this has been restricted by the thermionic limitation of SS, which is limited to 60 mV per decade at room temperature. Herein, we proposed a strategy that utilizes 2D semiconductors with an isolated-band feature as channels to realize sub-thermionic SS in MOSFETs. Through high-throughput calculations, we established a guiding principle that combines the atomic structure and orbital interaction to identify their sub-thermionic transport potential. This guides us to screen 192 candidates from the 2D material database comprising 1608 systems. Additionally, the physical relationship between the sub-thermionic transport performances and electronic structures is further revealed, which enables us to predict 15 systems with promising device performances for low-power applications with supply voltage below 0.5 V. This work opens a new way for the low-power electronics based on 2D materials and would inspire extensive interests in the experimental exploration of intrinsic steep-slope MOSFETs.-
dc.languageeng-
dc.publisherElsevier-
dc.relation.ispartofScience Bulletin-
dc.rightsThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.-
dc.subject2D materials-
dc.subjectDFT-NEGF calculations-
dc.subjectElectronic band structures-
dc.subjectSteep-slope transistors-
dc.subjectTransport properties-
dc.titleIdentifying atomically thin isolated-band channels for intrinsic steep-slope transistors by high-throughput study-
dc.typeArticle-
dc.identifier.doi10.1016/j.scib.2024.03.017-
dc.identifier.scopuseid_2-s2.0-85188815839-
dc.identifier.volume69-
dc.identifier.issue10-
dc.identifier.spage1427-
dc.identifier.epage1436-
dc.identifier.eissn2095-9281-
dc.identifier.issnl2095-9273-

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