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Article: Interlayer antiferromagnetic coupling in Tb3Fe5O12/Y3Fe5O12 bilayers
Title | Interlayer antiferromagnetic coupling in Tb3Fe5O12/Y3Fe5O12 bilayers |
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Authors | |
Issue Date | 28-Aug-2023 |
Publisher | American Institute of Physics |
Citation | Applied Physics Letters, 2023, v. 123, n. 9, p. 1-6 How to Cite? |
Abstract | The interlayer antiferromagnetic (AFM) coupling between thin films plays a significant role in the application of spintronics and magnetic memory devices. Previously, we observed AFM coupling phenomenon at low temperatures in rare-earth iron garnet bilayers epitaxially grown on Y3Al5O12 substrates. Here, we report a detailed study on the impacts of various factors, including temperature, crystallographic orientation, and layer thickness, on the AMF coupling and magnetization reversal behavior of such a bilayer system. A simple energy model qualitatively described the coupling behavior of the two layers during the magnetization reversal process. The interlayer coupling strength was calculated by measuring the minor magnetic hysteresis loops. The current results can serve as a reminder for future research on interlayer AFM coupling phenomena and highlight the potential of manipulating the magnetic properties in rare-earth garnet bilayers for spintronics studies and other applications. |
Persistent Identifier | http://hdl.handle.net/10722/346060 |
ISSN | 2023 Impact Factor: 3.5 2023 SCImago Journal Rankings: 0.976 |
DC Field | Value | Language |
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dc.contributor.author | Liang, Jing Ming | - |
dc.contributor.author | Zhao, Xu Wen | - |
dc.contributor.author | Yuan, Xin | - |
dc.contributor.author | Liu, Yu Kuai | - |
dc.contributor.author | Ng, Sheung Mei | - |
dc.contributor.author | Wong, Hon Fai | - |
dc.contributor.author | Li, Pei Gen | - |
dc.contributor.author | Zhou, Yan | - |
dc.contributor.author | Zhang, Fu Xiang | - |
dc.contributor.author | Mak, Chee Leung | - |
dc.contributor.author | Leung, Chi Wah | - |
dc.date.accessioned | 2024-09-07T00:30:22Z | - |
dc.date.available | 2024-09-07T00:30:22Z | - |
dc.date.issued | 2023-08-28 | - |
dc.identifier.citation | Applied Physics Letters, 2023, v. 123, n. 9, p. 1-6 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | http://hdl.handle.net/10722/346060 | - |
dc.description.abstract | <p>The interlayer antiferromagnetic (AFM) coupling between thin films plays a significant role in the application of spintronics and magnetic memory devices. Previously, we observed AFM coupling phenomenon at low temperatures in rare-earth iron garnet bilayers epitaxially grown on Y3Al5O12 substrates. Here, we report a detailed study on the impacts of various factors, including temperature, crystallographic orientation, and layer thickness, on the AMF coupling and magnetization reversal behavior of such a bilayer system. A simple energy model qualitatively described the coupling behavior of the two layers during the magnetization reversal process. The interlayer coupling strength was calculated by measuring the minor magnetic hysteresis loops. The current results can serve as a reminder for future research on interlayer AFM coupling phenomena and highlight the potential of manipulating the magnetic properties in rare-earth garnet bilayers for spintronics studies and other applications.</p> | - |
dc.language | eng | - |
dc.publisher | American Institute of Physics | - |
dc.relation.ispartof | Applied Physics Letters | - |
dc.title | Interlayer antiferromagnetic coupling in Tb3Fe5O12/Y3Fe5O12 bilayers | - |
dc.type | Article | - |
dc.identifier.doi | 10.1063/5.0157882 | - |
dc.identifier.scopus | eid_2-s2.0-85170821152 | - |
dc.identifier.volume | 123 | - |
dc.identifier.issue | 9 | - |
dc.identifier.spage | 1 | - |
dc.identifier.epage | 6 | - |
dc.identifier.eissn | 1077-3118 | - |
dc.identifier.issnl | 0003-6951 | - |