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Article: Welcome

TitleWelcome
Authors
Cline, Brian T.Heinrich-Barna, SteveWright, Peter J.Li, HaiViswanath, VinodHu, ShiyanWesling, PaulQu, GangGhosh, SwaroopIranmanesh, Ali A.
Issue Date2017
Citation
Proceedings - International Symposium on Quality Electronic Design, ISQED, 2017, article no. 7918277 How to Cite?
DOI: http://dx.doi.org/10.1109/ISQED.2017.7918277
Persistent Identifierhttp://hdl.handle.net/10722/336347
ISSN
1948-3287
2020 SCImago Journal Rankings: 0.228

 

DC FieldValueLanguage
dc.contributor.authorCline, Brian T.-
dc.contributor.authorHeinrich-Barna, Steve-
dc.contributor.authorWright, Peter J.-
dc.contributor.authorLi, Hai-
dc.contributor.authorViswanath, Vinod-
dc.contributor.authorHu, Shiyan-
dc.contributor.authorWesling, Paul-
dc.contributor.authorQu, Gang-
dc.contributor.authorGhosh, Swaroop-
dc.contributor.authorIranmanesh, Ali A.-
dc.date.accessioned2024-01-15T08:26:00Z-
dc.date.available2024-01-15T08:26:00Z-
dc.date.issued2017-
dc.identifier.citationProceedings - International Symposium on Quality Electronic Design, ISQED, 2017, article no. 7918277-
dc.identifier.issn1948-3287-
dc.identifier.urihttp://hdl.handle.net/10722/336347-
dc.languageeng-
dc.relation.ispartofProceedings - International Symposium on Quality Electronic Design, ISQED-
dc.titleWelcome-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/ISQED.2017.7918277-
dc.identifier.scopuseid_2-s2.0-85019637754-
dc.identifier.spagearticle no. 7918277-
dc.identifier.epagearticle no. 7918277-
dc.identifier.eissn1948-3295-

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