File Download

There are no files associated with this item.

  Links for fulltext
     (May Require Subscription)
Supplementary

Conference Paper: Quantum capacitance measurement for SWNT FET with thin ALD high-k dielectric

TitleQuantum capacitance measurement for SWNT FET with thin ALD high-k dielectric
Authors
Lu, YueruiDai, HongjieNishi, Yoshio
Issue Date2007
Citation
65th DRC Device Research Conference, 2007, p. 261-262 How to Cite?
DOI: http://dx.doi.org/10.1109/DRC.2007.4373745
Persistent Identifierhttp://hdl.handle.net/10722/334177

 

DC FieldValueLanguage
dc.contributor.authorLu, Yuerui-
dc.contributor.authorDai, Hongjie-
dc.contributor.authorNishi, Yoshio-
dc.date.accessioned2023-10-20T06:46:17Z-
dc.date.available2023-10-20T06:46:17Z-
dc.date.issued2007-
dc.identifier.citation65th DRC Device Research Conference, 2007, p. 261-262-
dc.identifier.urihttp://hdl.handle.net/10722/334177-
dc.languageeng-
dc.relation.ispartof65th DRC Device Research Conference-
dc.titleQuantum capacitance measurement for SWNT FET with thin ALD high-k dielectric-
dc.typeConference_Paper-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/DRC.2007.4373745-
dc.identifier.scopuseid_2-s2.0-47249137063-
dc.identifier.spage261-
dc.identifier.epage262-

Export via OAI-PMH Interface in XML Formats

OR

Export to Other Non-XML Formats