File Download
There are no files associated with this item.
Supplementary
-
Citations:
- Scopus: 0
- Appears in Collections:
Conference Paper: Carbon nanotube transistors with 60mV/decade switching and its capacitance measurement
Title | Carbon nanotube transistors with 60mV/decade switching and its capacitance measurement |
---|---|
Authors | |
Keywords | 60mV/decade Capacitance Carbon nanotube FET Mobility |
Issue Date | 2007 |
Citation | 2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings, 2007, v. 1, p. 57-60 How to Cite? |
Abstract | Recently, we have been able to approach the ultimate vertical scaling limit of carbon nanotube field effect transistors (FETs) and reliably achieve S ∼ 60 mV/decade at room temperature, by non-covalent functionalization of single walled carbon nonotubes (SWNTs) with ploy-T DNA molecules, which can impart functional groups of sufficient density and stability for uniform and conformai ALD of high-κ dielectrics (HfO2) with thickness down to 3 nm on SWNTs. Moreover, the small top gate stack capacitance (∼300aF/ μ m) of the SWNT FET has been successfully measured directly, using a special technique. The mobility of the SWNT FETs at room temperature is also extracted by the capacitance measured directly. |
Persistent Identifier | http://hdl.handle.net/10722/334149 |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lu, Yuerui | - |
dc.contributor.author | Dai, Hongjie | - |
dc.contributor.author | Nishi, Yoshio | - |
dc.date.accessioned | 2023-10-20T06:46:04Z | - |
dc.date.available | 2023-10-20T06:46:04Z | - |
dc.date.issued | 2007 | - |
dc.identifier.citation | 2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings, 2007, v. 1, p. 57-60 | - |
dc.identifier.uri | http://hdl.handle.net/10722/334149 | - |
dc.description.abstract | Recently, we have been able to approach the ultimate vertical scaling limit of carbon nanotube field effect transistors (FETs) and reliably achieve S ∼ 60 mV/decade at room temperature, by non-covalent functionalization of single walled carbon nonotubes (SWNTs) with ploy-T DNA molecules, which can impart functional groups of sufficient density and stability for uniform and conformai ALD of high-κ dielectrics (HfO2) with thickness down to 3 nm on SWNTs. Moreover, the small top gate stack capacitance (∼300aF/ μ m) of the SWNT FET has been successfully measured directly, using a special technique. The mobility of the SWNT FETs at room temperature is also extracted by the capacitance measured directly. | - |
dc.language | eng | - |
dc.relation.ispartof | 2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings | - |
dc.subject | 60mV/decade | - |
dc.subject | Capacitance | - |
dc.subject | Carbon nanotube | - |
dc.subject | FET | - |
dc.subject | Mobility | - |
dc.title | Carbon nanotube transistors with 60mV/decade switching and its capacitance measurement | - |
dc.type | Conference_Paper | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.scopus | eid_2-s2.0-34548027027 | - |
dc.identifier.volume | 1 | - |
dc.identifier.spage | 57 | - |
dc.identifier.epage | 60 | - |