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Article: Carbon nanotube field-effect transistors with integrated ohmic contacts and high-κ gate dielectrics

TitleCarbon nanotube field-effect transistors with integrated ohmic contacts and high-κ gate dielectrics
Authors
Issue Date2004
Citation
Nano Letters, 2004, v. 4, n. 3, p. 447-450 How to Cite?
AbstractHigh-performance enhancement-mode semiconducting carbon nanotube field-effect transistors (CNTFETs) are obtained by combining ohmic metal-tube contacts, high-dielectric-constant HfO2 films as gate insulators, and electrostatically doped nanotube segments as source/drain electrodes. The combination of these elements affords high ON currents and subthreshold swings of ∼70-80 mV/decade and allows for low OFF currents and suppressed ambipolar conduction. The doped source and drain approach resembles that of MOSFETs and can impart excellent OFF states to nanotube FETs under aggressive vertical scaling. This presents an important advantage over devices with a metal source/drain, or devices commonly referred to as Schottky barrier FETs.
Persistent Identifierhttp://hdl.handle.net/10722/334097
ISSN
2021 Impact Factor: 12.262
2020 SCImago Journal Rankings: 4.853
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorJavey, Ali-
dc.contributor.authorGuo, Jing-
dc.contributor.authorFarmer, Damon B.-
dc.contributor.authorWang, Qian-
dc.contributor.authorWang, Dunwei-
dc.contributor.authorGordon, Roy G.-
dc.contributor.authorLundstrom, Mark-
dc.contributor.authorDai, Hongjie-
dc.date.accessioned2023-10-20T06:45:37Z-
dc.date.available2023-10-20T06:45:37Z-
dc.date.issued2004-
dc.identifier.citationNano Letters, 2004, v. 4, n. 3, p. 447-450-
dc.identifier.issn1530-6984-
dc.identifier.urihttp://hdl.handle.net/10722/334097-
dc.description.abstractHigh-performance enhancement-mode semiconducting carbon nanotube field-effect transistors (CNTFETs) are obtained by combining ohmic metal-tube contacts, high-dielectric-constant HfO2 films as gate insulators, and electrostatically doped nanotube segments as source/drain electrodes. The combination of these elements affords high ON currents and subthreshold swings of ∼70-80 mV/decade and allows for low OFF currents and suppressed ambipolar conduction. The doped source and drain approach resembles that of MOSFETs and can impart excellent OFF states to nanotube FETs under aggressive vertical scaling. This presents an important advantage over devices with a metal source/drain, or devices commonly referred to as Schottky barrier FETs.-
dc.languageeng-
dc.relation.ispartofNano Letters-
dc.titleCarbon nanotube field-effect transistors with integrated ohmic contacts and high-κ gate dielectrics-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1021/nl035185x-
dc.identifier.scopuseid_2-s2.0-1642487759-
dc.identifier.volume4-
dc.identifier.issue3-
dc.identifier.spage447-
dc.identifier.epage450-
dc.identifier.isiWOS:000220170600013-

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