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- Publisher Website: 10.1016/j.actamat.2023.118880
- Scopus: eid_2-s2.0-85152593763
- WOS: WOS:000975594500001
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Article: Interface faceting–defaceting mediated by disconnections
Title | Interface faceting–defaceting mediated by disconnections |
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Authors | |
Keywords | Continuum modeling Disconnections faceting–defaceting transition Grain boundaries Interface migration |
Issue Date | 29-Mar-2023 |
Publisher | Elsevier |
Citation | Acta Materialia, 2023, v. 251 How to Cite? |
Abstract | An intrinsic feature of nearly all internal interfaces in crystalline systems (homo- and hetero-phase) is the presence of disconnections, namely topological line defects constrained to the interface that have both step and dislocation character. We demonstrate that elastic interactions between disconnections strongly affect the morphology and motion of interfaces, allowing for understanding and reconciling diverse key experiments. In particular, these elastic interactions strongly modify equilibrium interface morphologies compared with those solely determined by anisotropic surface energy, and affect the kinetics of migrating interfaces. They are also found to lead to a thermodynamic, first-order, finite-temperature, faceting–defaceting transition. We demonstrate these phenomena through numerical simulations based upon a general, continuum disconnection-based model for interface thermodynamics and kinetics applied to embedded particles/grains, steady-state interface migration geometries, and nominally flat interfaces. |
Persistent Identifier | http://hdl.handle.net/10722/331863 |
ISSN | 2023 Impact Factor: 8.3 2023 SCImago Journal Rankings: 2.916 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Qiu, Caihao | - |
dc.contributor.author | Salvalaglio, Marco | - |
dc.contributor.author | Srolovitz, David J | - |
dc.contributor.author | Han, Jian | - |
dc.date.accessioned | 2023-09-28T04:59:11Z | - |
dc.date.available | 2023-09-28T04:59:11Z | - |
dc.date.issued | 2023-03-29 | - |
dc.identifier.citation | Acta Materialia, 2023, v. 251 | - |
dc.identifier.issn | 1359-6454 | - |
dc.identifier.uri | http://hdl.handle.net/10722/331863 | - |
dc.description.abstract | <p>An intrinsic feature of nearly all internal interfaces in crystalline systems (homo- and hetero-phase) is the presence of disconnections, namely topological line defects constrained to the interface that have both step and dislocation character. We demonstrate that elastic interactions between disconnections strongly affect the morphology and motion of interfaces, allowing for understanding and reconciling diverse key experiments. In particular, these elastic interactions strongly modify equilibrium interface morphologies compared with those solely determined by anisotropic surface energy, and affect the kinetics of migrating interfaces. They are also found to lead to a thermodynamic, first-order, finite-temperature, faceting–defaceting transition. We demonstrate these phenomena through numerical simulations based upon a general, continuum disconnection-based model for <a href="https://www.sciencedirect.com/topics/physics-and-astronomy/interface-thermodynamics" title="Learn more about interface thermodynamics from ScienceDirect's AI-generated Topic Pages">interface thermodynamics</a> and kinetics applied to embedded particles/grains, steady-state interface migration geometries, and nominally flat interfaces.<br></p> | - |
dc.language | eng | - |
dc.publisher | Elsevier | - |
dc.relation.ispartof | Acta Materialia | - |
dc.subject | Continuum modeling | - |
dc.subject | Disconnections | - |
dc.subject | faceting–defaceting transition | - |
dc.subject | Grain boundaries | - |
dc.subject | Interface migration | - |
dc.title | Interface faceting–defaceting mediated by disconnections | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.actamat.2023.118880 | - |
dc.identifier.scopus | eid_2-s2.0-85152593763 | - |
dc.identifier.volume | 251 | - |
dc.identifier.eissn | 1873-2453 | - |
dc.identifier.isi | WOS:000975594500001 | - |
dc.identifier.issnl | 1359-6454 | - |