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Article: In Situ SEM Nanomanipulation and Nanomechanical/Electrical Characterization

TitleIn Situ SEM Nanomanipulation and Nanomechanical/Electrical Characterization
Authors
Lu, YangShen, YajingLiu, XinyuAhmad, Mohd Ridzuan BinChen, Yan
Issue Date2017
Citation
Scanning, 2017, v. 2017, article no. 8016571 How to Cite?
DOI: http://dx.doi.org/10.1155/2017/8016571
Persistent Identifierhttp://hdl.handle.net/10722/326151
ISSN
0161-0457
2021 Impact Factor: 1.750
2023 SCImago Journal Rankings: 0.471
ISI Accession Number ID
WOS:000414730100001

 

DC FieldValueLanguage
dc.contributor.authorLu, Yang-
dc.contributor.authorShen, Yajing-
dc.contributor.authorLiu, Xinyu-
dc.contributor.authorAhmad, Mohd Ridzuan Bin-
dc.contributor.authorChen, Yan-
dc.date.accessioned2023-03-09T09:58:23Z-
dc.date.available2023-03-09T09:58:23Z-
dc.date.issued2017-
dc.identifier.citationScanning, 2017, v. 2017, article no. 8016571-
dc.identifier.issn0161-0457-
dc.identifier.urihttp://hdl.handle.net/10722/326151-
dc.languageeng-
dc.relation.ispartofScanning-
dc.titleIn Situ SEM Nanomanipulation and Nanomechanical/Electrical Characterization-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1155/2017/8016571-
dc.identifier.pmid29238439-
dc.identifier.scopuseid_2-s2.0-85042430407-
dc.identifier.volume2017-
dc.identifier.spagearticle no. 8016571-
dc.identifier.epagearticle no. 8016571-
dc.identifier.eissn1932-8745-
dc.identifier.isiWOS:000414730100001-

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