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- Publisher Website: 10.1007/s11340-009-9222-0
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Article: A Multi-step method for In situ mechanical characterization of 1-D nanostructures using a novel micromechanical device
Title | A Multi-step method for In situ mechanical characterization of 1-D nanostructures using a novel micromechanical device |
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Authors | |
Keywords | 1D nanostructure FEA In situ Nanoindenter Micromechanical device |
Issue Date | 2010 |
Citation | Experimental Mechanics, 2010, v. 50, n. 1, p. 47-54 How to Cite? |
Abstract | A novel micromechanical device was developed to convert the compressive force applied by a nanoindenter into pure tensile loading at the sample stages inside a scanning electron microscope or a transmission electron microscope, in order to mechanically deform a one-dimensional nanostructure, such as a nanotube or a nanowire. Force vs. displacement curves for samples with Young's modulus above a threshold value can be obtained independently from readings of a quantitative high resolution nanoindenter with considerable accuracy, using a simple conversion relationship. However, in-depth finite element analysis revealed the existence of limitations for the device when testing samples with relatively low Young's modulus, where forces applied on samples derived from nanoindenter readings using a predetermined force conversion factor will no longer be accurate. In this paper, we will demonstrate a multi-step method which can alleviate this problem and make the device capable of testing a wide range of samples with considerable accuracy. © Society for Experimental Mechanics 2009. |
Persistent Identifier | http://hdl.handle.net/10722/326047 |
ISSN | 2023 Impact Factor: 2.0 2023 SCImago Journal Rankings: 0.584 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Lu, Y. | - |
dc.contributor.author | Ganesan, Y. | - |
dc.contributor.author | Lou, J. | - |
dc.date.accessioned | 2023-03-09T09:57:38Z | - |
dc.date.available | 2023-03-09T09:57:38Z | - |
dc.date.issued | 2010 | - |
dc.identifier.citation | Experimental Mechanics, 2010, v. 50, n. 1, p. 47-54 | - |
dc.identifier.issn | 0014-4851 | - |
dc.identifier.uri | http://hdl.handle.net/10722/326047 | - |
dc.description.abstract | A novel micromechanical device was developed to convert the compressive force applied by a nanoindenter into pure tensile loading at the sample stages inside a scanning electron microscope or a transmission electron microscope, in order to mechanically deform a one-dimensional nanostructure, such as a nanotube or a nanowire. Force vs. displacement curves for samples with Young's modulus above a threshold value can be obtained independently from readings of a quantitative high resolution nanoindenter with considerable accuracy, using a simple conversion relationship. However, in-depth finite element analysis revealed the existence of limitations for the device when testing samples with relatively low Young's modulus, where forces applied on samples derived from nanoindenter readings using a predetermined force conversion factor will no longer be accurate. In this paper, we will demonstrate a multi-step method which can alleviate this problem and make the device capable of testing a wide range of samples with considerable accuracy. © Society for Experimental Mechanics 2009. | - |
dc.language | eng | - |
dc.relation.ispartof | Experimental Mechanics | - |
dc.subject | 1D nanostructure | - |
dc.subject | FEA | - |
dc.subject | In situ Nanoindenter | - |
dc.subject | Micromechanical device | - |
dc.title | A Multi-step method for In situ mechanical characterization of 1-D nanostructures using a novel micromechanical device | - |
dc.type | Article | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1007/s11340-009-9222-0 | - |
dc.identifier.scopus | eid_2-s2.0-77949321050 | - |
dc.identifier.volume | 50 | - |
dc.identifier.issue | 1 | - |
dc.identifier.spage | 47 | - |
dc.identifier.epage | 54 | - |
dc.identifier.eissn | 1741-2765 | - |
dc.identifier.isi | WOS:000273479400005 | - |