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Conference Paper: Look Twice as Much as You Say

TitleLook Twice as Much as You Say
Authors
Zhang, CHuang, CLi, YZhang, XYe, YZhang, C
Issue Date2022
PublisherACM.
Citation
Proceedings of the 31st ACM International Conference on Information & Knowledge Management, p. 2519-2528 How to Cite?
DOI: http://dx.doi.org/10.1145/3511808.3557382
Persistent Identifierhttp://hdl.handle.net/10722/320896
ISBN
9781450392365

 

DC FieldValueLanguage
dc.contributor.authorZhang, C-
dc.contributor.authorHuang, C-
dc.contributor.authorLi, Y-
dc.contributor.authorZhang, X-
dc.contributor.authorYe, Y-
dc.contributor.authorZhang, C-
dc.date.accessioned2022-11-01T04:43:18Z-
dc.date.available2022-11-01T04:43:18Z-
dc.date.issued2022-
dc.identifier.citationProceedings of the 31st ACM International Conference on Information & Knowledge Management, p. 2519-2528-
dc.identifier.isbn9781450392365-
dc.identifier.urihttp://hdl.handle.net/10722/320896-
dc.languageeng-
dc.publisherACM. -
dc.relation.ispartofProceedings of the 31st ACM International Conference on Information & Knowledge Management-
dc.titleLook Twice as Much as You Say-
dc.typeConference_Paper-
dc.identifier.emailHuang, C: chuang7@hku.hk-
dc.identifier.authorityHuang, C=rp02897-
dc.identifier.doi10.1145/3511808.3557382-
dc.identifier.hkuros341119-
dc.identifier.spage2519-
dc.identifier.epage2528-
dc.publisher.placeNew York, NY, USA-

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