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Conference Paper: Electron beam-induced tunable radiation from silicon-only structures in the near-infrared

TitleElectron beam-induced tunable radiation from silicon-only structures in the near-infrared
Authors
Roques-Carmes, CharlesKooi, Steven E.Massuda, AviramZaidi, AunYang, YiYang, YujiaBerggren, Karl K.Kaminer, IdoSoljacic, Marin
Issue Date2018
Citation
Optics InfoBase Conference Papers, 2018, v. Part F94-CLEO_SI 2018 How to Cite?
DOI: http://dx.doi.org/10.1364/CLEO_SI.2018.SM4I.2
AbstractWe experimentally demonstrate the generation of tunable radiation from silicon-only periodic structures in the near-infrared (up to 1550nm). Spontaneous emission from low-energy electrons (down to 2 keV) is recorded in a modified scanning electron microscope, matching our theoretical predictions.
Persistent Identifierhttp://hdl.handle.net/10722/317068

 

DC FieldValueLanguage
dc.contributor.authorRoques-Carmes, Charles-
dc.contributor.authorKooi, Steven E.-
dc.contributor.authorMassuda, Aviram-
dc.contributor.authorZaidi, Aun-
dc.contributor.authorYang, Yi-
dc.contributor.authorYang, Yujia-
dc.contributor.authorBerggren, Karl K.-
dc.contributor.authorKaminer, Ido-
dc.contributor.authorSoljacic, Marin-
dc.date.accessioned2022-09-19T06:18:43Z-
dc.date.available2022-09-19T06:18:43Z-
dc.date.issued2018-
dc.identifier.citationOptics InfoBase Conference Papers, 2018, v. Part F94-CLEO_SI 2018-
dc.identifier.urihttp://hdl.handle.net/10722/317068-
dc.description.abstractWe experimentally demonstrate the generation of tunable radiation from silicon-only periodic structures in the near-infrared (up to 1550nm). Spontaneous emission from low-energy electrons (down to 2 keV) is recorded in a modified scanning electron microscope, matching our theoretical predictions.-
dc.languageeng-
dc.relation.ispartofOptics InfoBase Conference Papers-
dc.titleElectron beam-induced tunable radiation from silicon-only structures in the near-infrared-
dc.typeConference_Paper-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1364/CLEO_SI.2018.SM4I.2-
dc.identifier.scopuseid_2-s2.0-85048968402-
dc.identifier.volumePart F94-CLEO_SI 2018-

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