File Download

There are no files associated with this item.

  Links for fulltext
     (May Require Subscription)
Supplementary

Article: Electronic gap characterization at mesoscopic scale via scanning probe microscopy under ambient conditions

TitleElectronic gap characterization at mesoscopic scale via scanning probe microscopy under ambient conditions
Authors
Li, DWang, XMO, XTse, CMECui, X
Issue Date2022
PublisherNature Publishing Groups. The Journal's web site is located at http://www.nature.com/ncomms/index.html
Citation
Nature Communications, 2022, v. 13, p. 4648 How to Cite?
DOI: http://dx.doi.org/10.1038/s41467-022-32439-1
Persistent Identifierhttp://hdl.handle.net/10722/315596
ISI Accession Number ID
WOS:000837856500020

 

DC FieldValueLanguage
dc.contributor.authorLi, D-
dc.contributor.authorWang, X-
dc.contributor.authorMO, X-
dc.contributor.authorTse, CME-
dc.contributor.authorCui, X-
dc.date.accessioned2022-08-19T09:00:50Z-
dc.date.available2022-08-19T09:00:50Z-
dc.date.issued2022-
dc.identifier.citationNature Communications, 2022, v. 13, p. 4648-
dc.identifier.urihttp://hdl.handle.net/10722/315596-
dc.languageeng-
dc.publisherNature Publishing Groups. The Journal's web site is located at http://www.nature.com/ncomms/index.html-
dc.relation.ispartofNature Communications-
dc.titleElectronic gap characterization at mesoscopic scale via scanning probe microscopy under ambient conditions-
dc.typeArticle-
dc.identifier.emailLi, D: iodineli@HKUCC-COM.hku.hk-
dc.identifier.emailWang, X: xiongw@hku.hk-
dc.identifier.emailTse, CME: ecmtse@hku.hk-
dc.identifier.emailCui, X: xdcui@hku.hk-
dc.identifier.authorityTse, CME=rp02452-
dc.identifier.authorityCui, X=rp00689-
dc.identifier.doi10.1038/s41467-022-32439-1-
dc.identifier.hkuros335884-
dc.identifier.volume13-
dc.identifier.spage4648-
dc.identifier.epage4648-
dc.identifier.isiWOS:000837856500020-

Export via OAI-PMH Interface in XML Formats

OR

Export to Other Non-XML Formats