Depletion-layer-induced size effects in ferroelectric thin films: A Ginzburg-Landau model study

Abstract

A Ginzburg-Landau model is used to demonstrate how depletion layers give rise to thickness-dependent ferroelectric properties in thin films. It is shown that free charge layers at the film-electrode interface can result in an internal electric field in the bulk of the film even when no external voltage is applied. At high values of the donor dopant density and small thicknesses, this internal electric field can be strong enough to lead to the formation of a domain pattern. This causes a drop in the remnant polarization, a direct demonstration of the important role free charge plays in thin ferroelectric films. © 2012 American Physical Society.