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- Publisher Website: 10.1063/1.337222
- Scopus: eid_2-s2.0-36549094711
- WOS: WOS:A1986D621300039
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Article: Surface segregation during deposition
Title | Surface segregation during deposition |
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Authors | |
Issue Date | 1986 |
Citation | Journal of Applied Physics, 1986, v. 60, n. 5, p. 1793-1796 How to Cite? |
Abstract | Both the steady-state and transient solute (impurity) concentrations at the surface of a film during its deposition are calculated as a function of deposition rate, temperature, diffusivity, bulk film solute concentration, and segregation energy. The steady-state solute concentration at the surface is found to increase upon increasing either the solute diffusivity or the magnitude of the (negative) segregation energy, or upon decreasing the deposition rate. The transient concentration profile at the start of deposition relaxes toward the steady-state profile as 1/t. Implications of the present results for film growth mechanisms and methods to control the degree of segregation via manipulation of deposition parameters are discussed. |
Persistent Identifier | http://hdl.handle.net/10722/303320 |
ISSN | 2023 Impact Factor: 2.7 2023 SCImago Journal Rankings: 0.649 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Eykholt, R. | - |
dc.contributor.author | Srolovitz, D. J. | - |
dc.date.accessioned | 2021-09-15T08:25:04Z | - |
dc.date.available | 2021-09-15T08:25:04Z | - |
dc.date.issued | 1986 | - |
dc.identifier.citation | Journal of Applied Physics, 1986, v. 60, n. 5, p. 1793-1796 | - |
dc.identifier.issn | 0021-8979 | - |
dc.identifier.uri | http://hdl.handle.net/10722/303320 | - |
dc.description.abstract | Both the steady-state and transient solute (impurity) concentrations at the surface of a film during its deposition are calculated as a function of deposition rate, temperature, diffusivity, bulk film solute concentration, and segregation energy. The steady-state solute concentration at the surface is found to increase upon increasing either the solute diffusivity or the magnitude of the (negative) segregation energy, or upon decreasing the deposition rate. The transient concentration profile at the start of deposition relaxes toward the steady-state profile as 1/t. Implications of the present results for film growth mechanisms and methods to control the degree of segregation via manipulation of deposition parameters are discussed. | - |
dc.language | eng | - |
dc.relation.ispartof | Journal of Applied Physics | - |
dc.title | Surface segregation during deposition | - |
dc.type | Article | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1063/1.337222 | - |
dc.identifier.scopus | eid_2-s2.0-36549094711 | - |
dc.identifier.volume | 60 | - |
dc.identifier.issue | 5 | - |
dc.identifier.spage | 1793 | - |
dc.identifier.epage | 1796 | - |
dc.identifier.isi | WOS:A1986D621300039 | - |