File Download
There are no files associated with this item.
Links for fulltext
(May Require Subscription)
- Publisher Website: 10.1016/j.actamat.2004.02.005
- Scopus: eid_2-s2.0-2342628603
- WOS: WOS:000221558700008
- Find via
Supplementary
- Citations:
- Appears in Collections:
Article: Computer simulation of the elastically driven migration of a flat grain boundary
Title | Computer simulation of the elastically driven migration of a flat grain boundary |
---|---|
Authors | |
Keywords | Molecular dynamics Mobility Nickel Grain boundaries |
Issue Date | 2004 |
Citation | Acta Materialia, 2004, v. 52, n. 9, p. 2569-2576 How to Cite? |
Abstract | This paper describes a strategy for the measurement of boundary mobility using molecular dynamics (MD) simulations and its application to the migration of nominally flat 〈0 0 1〉 tilt grain boundaries in nickel, as described using an EAM potential. Determination of the driving force for boundary migration requires proper accounting for non-linear elastic effects for strains of the magnitude needed for MD simulation of stress-driven boundary migration. The grain boundary velocity was found to be a non-linear function of driving force, especially at low temperature. However, extrapolation of the data to small driving force allows for the determination of the mobility at all temperatures. The activation energy for grain boundary migration was found to be 0.26 eV. This demonstrates that boundary migration in pure metals is not athermal, but the activation energy is much smaller than expected based upon experimental measurements. This discrepancy is similar to that found in earlier simulation measurements. © 2004 Published by Elsvier Ltd on behalf of Acta Materialia Inc. |
Persistent Identifier | http://hdl.handle.net/10722/303250 |
ISSN | 2023 Impact Factor: 8.3 2023 SCImago Journal Rankings: 2.916 |
ISI Accession Number ID |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Zhang, H. | - |
dc.contributor.author | Mendelev, M. I. | - |
dc.contributor.author | Srolovitz, D. J. | - |
dc.date.accessioned | 2021-09-15T08:24:56Z | - |
dc.date.available | 2021-09-15T08:24:56Z | - |
dc.date.issued | 2004 | - |
dc.identifier.citation | Acta Materialia, 2004, v. 52, n. 9, p. 2569-2576 | - |
dc.identifier.issn | 1359-6454 | - |
dc.identifier.uri | http://hdl.handle.net/10722/303250 | - |
dc.description.abstract | This paper describes a strategy for the measurement of boundary mobility using molecular dynamics (MD) simulations and its application to the migration of nominally flat 〈0 0 1〉 tilt grain boundaries in nickel, as described using an EAM potential. Determination of the driving force for boundary migration requires proper accounting for non-linear elastic effects for strains of the magnitude needed for MD simulation of stress-driven boundary migration. The grain boundary velocity was found to be a non-linear function of driving force, especially at low temperature. However, extrapolation of the data to small driving force allows for the determination of the mobility at all temperatures. The activation energy for grain boundary migration was found to be 0.26 eV. This demonstrates that boundary migration in pure metals is not athermal, but the activation energy is much smaller than expected based upon experimental measurements. This discrepancy is similar to that found in earlier simulation measurements. © 2004 Published by Elsvier Ltd on behalf of Acta Materialia Inc. | - |
dc.language | eng | - |
dc.relation.ispartof | Acta Materialia | - |
dc.subject | Molecular dynamics | - |
dc.subject | Mobility | - |
dc.subject | Nickel | - |
dc.subject | Grain boundaries | - |
dc.title | Computer simulation of the elastically driven migration of a flat grain boundary | - |
dc.type | Article | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1016/j.actamat.2004.02.005 | - |
dc.identifier.scopus | eid_2-s2.0-2342628603 | - |
dc.identifier.volume | 52 | - |
dc.identifier.issue | 9 | - |
dc.identifier.spage | 2569 | - |
dc.identifier.epage | 2576 | - |
dc.identifier.isi | WOS:000221558700008 | - |