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- Publisher Website: 10.1115/TRIB2004-64336
- Scopus: eid_2-s2.0-21244493676
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Conference Paper: Asperity contact evolution: Capillarity and electromigration effects
Title | Asperity contact evolution: Capillarity and electromigration effects |
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Authors | |
Issue Date | 2004 |
Citation | Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004, 2004, n. PART A, p. 33-35 How to Cite? |
Abstract | The evolution of an idealized asperity under the action of both capillarity and electromigration was studied. In this study, the acatual random distribution of asperity contacts along the surfaces with a periodic arrangement of identical contacts were replaced. The evolution of the asperity contact morphology was modeled within the framework of the phase field model. It was observed that if the voltage is increased, then the electromigration will dominate the evolution of the contact morphology. |
Persistent Identifier | http://hdl.handle.net/10722/303245 |
DC Field | Value | Language |
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dc.contributor.author | Kim, Ji Hee | - |
dc.contributor.author | Cha, Pil Ryung | - |
dc.contributor.author | Srolovitz, David J. | - |
dc.date.accessioned | 2021-09-15T08:24:55Z | - |
dc.date.available | 2021-09-15T08:24:55Z | - |
dc.date.issued | 2004 | - |
dc.identifier.citation | Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004, 2004, n. PART A, p. 33-35 | - |
dc.identifier.uri | http://hdl.handle.net/10722/303245 | - |
dc.description.abstract | The evolution of an idealized asperity under the action of both capillarity and electromigration was studied. In this study, the acatual random distribution of asperity contacts along the surfaces with a periodic arrangement of identical contacts were replaced. The evolution of the asperity contact morphology was modeled within the framework of the phase field model. It was observed that if the voltage is increased, then the electromigration will dominate the evolution of the contact morphology. | - |
dc.language | eng | - |
dc.relation.ispartof | Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004 | - |
dc.title | Asperity contact evolution: Capillarity and electromigration effects | - |
dc.type | Conference_Paper | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1115/TRIB2004-64336 | - |
dc.identifier.scopus | eid_2-s2.0-21244493676 | - |
dc.identifier.issue | PART A | - |
dc.identifier.spage | 33 | - |
dc.identifier.epage | 35 | - |