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Article: Electrostatic field-induced surface instability

TitleElectrostatic field-induced surface instability
Authors
Issue Date2004
Citation
Applied Physics Letters, 2004, v. 85, n. 21, p. 4917-4919 How to Cite?
AbstractWe examine the thermodynamics and evolution of the morphology of a metal surface in the presence of a large electric field. A flat surface is unstable for all finite electric fields E with a critical wavelength proportional to E-1 or E-2 at small and large fields, respectively. The instability wavelength that grows the fastest during surface diffusion-limited evolution scales in the same manner. Such instabilities are important for scanning probe microscopies and are becoming increasingly important in microelectromechanical systems applications as device dimensions are reduced. © 2004 American Institute of Physics.
Persistent Identifierhttp://hdl.handle.net/10722/303240
ISSN
2023 Impact Factor: 3.5
2023 SCImago Journal Rankings: 0.976
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorDu, Danxu-
dc.contributor.authorSrolovitz, David-
dc.date.accessioned2021-09-15T08:24:54Z-
dc.date.available2021-09-15T08:24:54Z-
dc.date.issued2004-
dc.identifier.citationApplied Physics Letters, 2004, v. 85, n. 21, p. 4917-4919-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10722/303240-
dc.description.abstractWe examine the thermodynamics and evolution of the morphology of a metal surface in the presence of a large electric field. A flat surface is unstable for all finite electric fields E with a critical wavelength proportional to E-1 or E-2 at small and large fields, respectively. The instability wavelength that grows the fastest during surface diffusion-limited evolution scales in the same manner. Such instabilities are important for scanning probe microscopies and are becoming increasingly important in microelectromechanical systems applications as device dimensions are reduced. © 2004 American Institute of Physics.-
dc.languageeng-
dc.relation.ispartofApplied Physics Letters-
dc.titleElectrostatic field-induced surface instability-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1063/1.1826233-
dc.identifier.scopuseid_2-s2.0-19144364133-
dc.identifier.volume85-
dc.identifier.issue21-
dc.identifier.spage4917-
dc.identifier.epage4919-
dc.identifier.isiWOS:000225300600030-

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