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Article: Direct formation of wafer scale graphene thin layers on insulating substrates by chemical vapor deposition
Title | Direct formation of wafer scale graphene thin layers on insulating substrates by chemical vapor deposition |
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Authors | |
Keywords | Graphene graphitization transparent conductive film Raman spectroscopy chemical vapor deposition |
Issue Date | 2011 |
Citation | Nano Letters, 2011, v. 11, n. 9, p. 3612-3616 How to Cite? |
Abstract | Direct formation of high-quality and wafer scale graphene thin layers on insulating gate dielectrics such as SiO is emergent for graphene electronics using Si-wafer compatible fabrication. Here, we report that in a chemical vapor deposition process the carbon species dissociated on Cu surfaces not only result in graphene layers on top of the catalytic Cu thin films but also diffuse through Cu grain boundaries to the interface between Cu and underlying dielectrics. Optimization of the process parameters leads to a continuous and large-area graphene thin layers directly formed on top of the dielectrics. The bottom-gated transistor characteristics for the graphene films have shown quite comparable carrier mobility compared to the top-layer graphene. The proposed method allows us to achieve wafer-sized graphene on versatile insulating substrates without the need of graphene transfer. © 2011 American Chemical Society. 2 |
Persistent Identifier | http://hdl.handle.net/10722/298536 |
ISSN | 2023 Impact Factor: 9.6 2023 SCImago Journal Rankings: 3.411 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Su, Ching Yuan | - |
dc.contributor.author | Lu, Ang Yu | - |
dc.contributor.author | Wu, Chih Yu | - |
dc.contributor.author | Li, Yi Te | - |
dc.contributor.author | Liu, Keng Ku | - |
dc.contributor.author | Zhang, Wenjing | - |
dc.contributor.author | Lin, Shi Yen | - |
dc.contributor.author | Juang, Zheng Yu | - |
dc.contributor.author | Zhong, Yuan Liang | - |
dc.contributor.author | Chen, Fu Rong | - |
dc.contributor.author | Li, Lain Jong | - |
dc.date.accessioned | 2021-04-08T03:08:43Z | - |
dc.date.available | 2021-04-08T03:08:43Z | - |
dc.date.issued | 2011 | - |
dc.identifier.citation | Nano Letters, 2011, v. 11, n. 9, p. 3612-3616 | - |
dc.identifier.issn | 1530-6984 | - |
dc.identifier.uri | http://hdl.handle.net/10722/298536 | - |
dc.description.abstract | Direct formation of high-quality and wafer scale graphene thin layers on insulating gate dielectrics such as SiO is emergent for graphene electronics using Si-wafer compatible fabrication. Here, we report that in a chemical vapor deposition process the carbon species dissociated on Cu surfaces not only result in graphene layers on top of the catalytic Cu thin films but also diffuse through Cu grain boundaries to the interface between Cu and underlying dielectrics. Optimization of the process parameters leads to a continuous and large-area graphene thin layers directly formed on top of the dielectrics. The bottom-gated transistor characteristics for the graphene films have shown quite comparable carrier mobility compared to the top-layer graphene. The proposed method allows us to achieve wafer-sized graphene on versatile insulating substrates without the need of graphene transfer. © 2011 American Chemical Society. 2 | - |
dc.language | eng | - |
dc.relation.ispartof | Nano Letters | - |
dc.subject | Graphene | - |
dc.subject | graphitization | - |
dc.subject | transparent conductive film | - |
dc.subject | Raman spectroscopy | - |
dc.subject | chemical vapor deposition | - |
dc.title | Direct formation of wafer scale graphene thin layers on insulating substrates by chemical vapor deposition | - |
dc.type | Article | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1021/nl201362n | - |
dc.identifier.scopus | eid_2-s2.0-80052804742 | - |
dc.identifier.volume | 11 | - |
dc.identifier.issue | 9 | - |
dc.identifier.spage | 3612 | - |
dc.identifier.epage | 3616 | - |
dc.identifier.eissn | 1530-6992 | - |
dc.identifier.isi | WOS:000294790200018 | - |
dc.identifier.issnl | 1530-6984 | - |