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Article: Direct formation of wafer scale graphene thin layers on insulating substrates by chemical vapor deposition

TitleDirect formation of wafer scale graphene thin layers on insulating substrates by chemical vapor deposition
Authors
KeywordsGraphene
graphitization
transparent conductive film
Raman spectroscopy
chemical vapor deposition
Issue Date2011
Citation
Nano Letters, 2011, v. 11, n. 9, p. 3612-3616 How to Cite?
AbstractDirect formation of high-quality and wafer scale graphene thin layers on insulating gate dielectrics such as SiO is emergent for graphene electronics using Si-wafer compatible fabrication. Here, we report that in a chemical vapor deposition process the carbon species dissociated on Cu surfaces not only result in graphene layers on top of the catalytic Cu thin films but also diffuse through Cu grain boundaries to the interface between Cu and underlying dielectrics. Optimization of the process parameters leads to a continuous and large-area graphene thin layers directly formed on top of the dielectrics. The bottom-gated transistor characteristics for the graphene films have shown quite comparable carrier mobility compared to the top-layer graphene. The proposed method allows us to achieve wafer-sized graphene on versatile insulating substrates without the need of graphene transfer. © 2011 American Chemical Society. 2
Persistent Identifierhttp://hdl.handle.net/10722/298536
ISSN
2023 Impact Factor: 9.6
2023 SCImago Journal Rankings: 3.411
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorSu, Ching Yuan-
dc.contributor.authorLu, Ang Yu-
dc.contributor.authorWu, Chih Yu-
dc.contributor.authorLi, Yi Te-
dc.contributor.authorLiu, Keng Ku-
dc.contributor.authorZhang, Wenjing-
dc.contributor.authorLin, Shi Yen-
dc.contributor.authorJuang, Zheng Yu-
dc.contributor.authorZhong, Yuan Liang-
dc.contributor.authorChen, Fu Rong-
dc.contributor.authorLi, Lain Jong-
dc.date.accessioned2021-04-08T03:08:43Z-
dc.date.available2021-04-08T03:08:43Z-
dc.date.issued2011-
dc.identifier.citationNano Letters, 2011, v. 11, n. 9, p. 3612-3616-
dc.identifier.issn1530-6984-
dc.identifier.urihttp://hdl.handle.net/10722/298536-
dc.description.abstractDirect formation of high-quality and wafer scale graphene thin layers on insulating gate dielectrics such as SiO is emergent for graphene electronics using Si-wafer compatible fabrication. Here, we report that in a chemical vapor deposition process the carbon species dissociated on Cu surfaces not only result in graphene layers on top of the catalytic Cu thin films but also diffuse through Cu grain boundaries to the interface between Cu and underlying dielectrics. Optimization of the process parameters leads to a continuous and large-area graphene thin layers directly formed on top of the dielectrics. The bottom-gated transistor characteristics for the graphene films have shown quite comparable carrier mobility compared to the top-layer graphene. The proposed method allows us to achieve wafer-sized graphene on versatile insulating substrates without the need of graphene transfer. © 2011 American Chemical Society. 2-
dc.languageeng-
dc.relation.ispartofNano Letters-
dc.subjectGraphene-
dc.subjectgraphitization-
dc.subjecttransparent conductive film-
dc.subjectRaman spectroscopy-
dc.subjectchemical vapor deposition-
dc.titleDirect formation of wafer scale graphene thin layers on insulating substrates by chemical vapor deposition-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1021/nl201362n-
dc.identifier.scopuseid_2-s2.0-80052804742-
dc.identifier.volume11-
dc.identifier.issue9-
dc.identifier.spage3612-
dc.identifier.epage3616-
dc.identifier.eissn1530-6992-
dc.identifier.isiWOS:000294790200018-
dc.identifier.issnl1530-6984-

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